Three Dimension Minimal Realization in Linear System of Max-algebra

Author(s):  
Zhimin Sun ◽  
Wende Chen
2021 ◽  
Vol 9 (07) ◽  
pp. 275-283
Author(s):  
Anas Salim Youns ◽  

The mainobjective of this research is to study the stability of thenon-lineardynamical system by using the linearization technique of three dimension systems toobtain an approximate linear system and find its stability. We apply this technique to reaches to the stability of the public non linear dynamical systems of dimension. Finally, some proposed examples (example (1) and example (2)) are given to explain this technique and used the corollary.


Author(s):  
Suichu Luo ◽  
John R. Dunlap ◽  
Richard W. Williams ◽  
David C. Joy

In analytical electron microscopy, it is often important to know the local thickness of a sample. The conventional method used for measuring specimen thickness by EELS is:where t is the specimen thickness, λi is the total inelastic mean free path, IT is the total intensity in an EEL spectrum, and I0 is the zero loss peak intensity. This is rigorouslycorrect only if the electrons are collected over all scattering angles and all energy losses. However, in most experiments only a fraction of the scattered electrons are collected due to a limited collection semi-angle. To overcome this problem we present a method based on three-dimension Poisson statistics, which takes into account both the inelastic and elastic mixed angular correction.The three-dimension Poisson formula is given by:where I is the unscattered electron intensity; t is the sample thickness; λi and λe are the inelastic and elastic scattering mean free paths; Si (θ) and Se(θ) are normalized single inelastic and elastic angular scattering distributions respectively ; F(E) is the single scattering normalized energy loss distribution; D(E,θ) is the plural scattering distribution,


1981 ◽  
Vol 64 (10) ◽  
pp. 9-17 ◽  
Author(s):  
Toshimichi Saito ◽  
Hiroichi Fujita

1991 ◽  
Vol 1 (9) ◽  
pp. 1217-1227 ◽  
Author(s):  
A. A. Bakasov ◽  
N. V. Bakasova ◽  
E. K. Bashkirov ◽  
V. Chmielowski
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