Electrophysiological Data Processing Using a Dynamic Range Compressor Coupled to a Ten Bits A/D Convertion Port

2011 ◽  
Author(s):  
Florin Babarada ◽  
Cristian Ravariu ◽  
Arhip Janel
Keyword(s):  
Data Processing ◽  
Dynamic Range ◽  
Electrophysiological Data

scholarly journals The new NCPSS BL19U2 beamline at the SSRF for small-angle X-ray scattering from biological macromolecules in solution

2016 ◽  
Vol 49 (5) ◽  
pp. 1428-1432 ◽  
Author(s):  
Na Li ◽  
Xiuhong Li ◽  
Yuzhu Wang ◽  
Guangfeng Liu ◽  
Ping Zhou ◽  
...  
Keyword(s):  
Data Processing ◽  
Small Angle ◽  
Dynamic Range ◽  
Silicon Crystal ◽  
High Dynamic Range ◽  
Biological Macromolecules ◽  
Shanghai Synchrotron Radiation Facility ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

The beamline BL19U2 is located in the Shanghai Synchrotron Radiation Facility (SSRF) and is its first beamline dedicated to biological material small-angle X-ray scattering (BioSAXS). The electrons come from an undulator which can provide high brilliance for the BL19U2 end stations. A double flat silicon crystal (111) monochromator is used in BL19U2, with a tunable monochromatic photon energy ranging from 7 to 15 keV. To meet the rapidly growing demands of crystallographers, biochemists and structural biologists, the BioSAXS beamline allows manual and automatic sample loading/unloading. A Pilatus 1M detector (Dectris) is employed for data collection, characterized by a high dynamic range and a short readout time. The highly automated data processing pipeline SASFLOW was integrated into BL19U2, with help from the BioSAXS group of the European Molecular Biology Laboratory (EMBL, Hamburg), which provides a user-friendly interface for data processing. The BL19U2 beamline was officially opened to users in March 2015. To date, feedback from users has been positive and the number of experimental proposals at BL19U2 is increasing. A description of the new BioSAXS beamline and the setup characteristics is given, together with examples of data obtained.

The Vibroseis system: A high‐frequency tool

Geophysics ◽  
1981 ◽  
Vol 46 (12) ◽  
pp. 1657-1666 ◽  
Author(s):  
Wm. L. Chapman ◽  
G. L. Brown ◽  
D. W. Fair
Keyword(s):  
Data Processing ◽  
High Frequency ◽  
Dynamic Range ◽  
Spectral Response ◽  
Seismic Signal ◽  
Acquisition System ◽  
System Response ◽  
System A ◽  
Seismic Acquisition ◽  
Correct Application

Exploration methods are extended to their limits as we continue the search for energy resources. Successful application of high‐frequency seismic method requires evaluating each element in the seismic acquisition system and ensuring that each part of the system contributes to the success of the method. This extends from seismic signal generation through data processing where good equipment performance and correct parameter selections are required. The Vibroseis® system depends upon the ability of vibrators to generate synchronous, repeatable sweeps over the frequency range of interest. To support our high‐frequency seismic efforts, Conoco, Inc., has developed and built a new high‐frequency vibrator. This paper includes some of the consideration used in building the vibrator, along with typical baseplate responses showing excellent drive levels to the design goal of 200 Hz. With an excellent source available, correct application is essential to assure retention of high‐frequency data. Recording offsets, array lengths, and array sampling must be selected for the sweep frequencies used. Also, approximate matching of the data acquisition system response to the spectral response of the earth reduces the dynamic range requirements for recording systems and subsequent data processing. Data are included showing the successful application of high‐frequency techniques to stratigraphic exploration problems.

An Electricity Parameter Measurement for Off-Grid PWM Converter

2013 ◽  
Vol 325-326 ◽  
pp. 742-746
Author(s):  
Fang Yuan Chen ◽  
Jian Huang
Keyword(s):  
Data Processing ◽  
Feasible Solution ◽  
Dynamic Range ◽  
Input Voltage ◽  
Time Data ◽  
Pwm Converter ◽  
Pwm Converters ◽  
The Troubles ◽  
Real Time Data ◽  
Real Time Data Processing

The input voltage of off-grid PWM converters has a great dynamic range in amplitude and frequency. In addition, the frequent changing of these parameters also makes it hard to measure preciously via traditional ways. Details of window function are presented. A modified FFT spectrum analyzing method using interpolation is also given and checked. Finally, a feasible solution which balances both precision and real-time data processing comes up considering the speed of MCUs mainly used in industry. Simulations and experiments show that this solution settles the troubles which cant be cleared up by traditional methods.

scholarly journals PENINGKATAN RESOLUSI SENSOR LOAD CELL PADA TIMBANGAN ELEKTRONIK

JURNAL ELTEK ◽  
2018 ◽  
Vol 16 (1) ◽  
pp. 37
Author(s):  
Eka Mandayatma
Keyword(s):  
Data Processing ◽  
Dynamic Range ◽  
Measurement Range ◽  
Load Cell ◽  
Load Range ◽  
Business World ◽  
Amplifier Circuit ◽  
Cell Measurement ◽  
Direct Use ◽  
Electronic Signal

Electronic scales are heavy gauges that are widely used both in the laboratory and in the business world. One of the main sensors of electronic scales is the load cell. The direct use of load cell will result in the achievement of the standard resolution of the load cell or ADC system used, so the resolution of the scales will be quite low as it is determined only by the load cell measurement range and the ADC resolution where the dynamic range of the ADC is not reached.In this article will be made electronic efforts to increase the resolution of the scales so that the accuracy of weighing can be better. Improved resolution attempts are made with electronic signal processor and conditioners, among others, by amplifying, summing and leveling amplifiers and to prevent noise being attempted by filtering. Data processing is done by comparing the resolution value of Load cell without signal conditioner and load cell resolution with signal conditioner. Load Cell with a load range of 0 - 5 kg in conditioning with 200x gain obtained output 113 mV to 1200 mV. With a standard ADC at a resolution of 20 mV / bit will be obtained 0000 0110 to 0011 1110 By adding a Leveling Amplifier circuit obtained output 48 mV for load 0 kg and 4.87 Volt for 5 kg load, ADC output in the range 0000 0010 to 1111 1100. Usage ADC without leveling 21% and with 98% leveling. Without leveling weighing resolution is 89 grm / bit and with 20 grm / bit leveling. Increased weighing resolution of 345%.

scholarly journals Μελέτη, ανάλυση και βελτίωση της λειτουργίας αερομεταφερόμενου ραντάρ συνθετικής απεικόνισης (SAR) χαμηλών συχνοτήτων

2002 ◽  
Author(s):  
Αθανάσιος Πότσης
Keyword(s):  
Data Processing ◽  
High Performance ◽  
Dynamic Range ◽  
Low Frequency ◽  
Low Noise ◽  
Electromagnetic Spectrum ◽  
System Operation ◽  
Low Frequencies ◽  
Technological Advances ◽  
Sar Data

Because of its high resolution, frequency scattering properties and indifference to day/night or cloud cover, Synthetic Aperture Radar (SAR) has become into vogue in the last years. The field of SAR remote sensing has changed dramatically with the operational introduction of new high performance signal processing techniques and new operational modes, like the polarimetry in 1980’s and the interferometry in 1990’s. Additionally, technological advances in antenna design, low noise amplifiers, band-pass filters, digital receiver technology and high frequency digital sampling devises, increase the availability and the performance of airborne as well as spaceborne SAR sensors. All these technological advances result to real time SAR system operation and in most of the frequency bands of the electromagnetic spectrum. These advanced hardware components combined with the new radar techniques result to large variety of operational and research applications. In several of the new coming applications there is the need for a SAR system to penetrate vegetation and foliage. As a result of this, a new class of SAR systems, using low frequencies, has emerged. The combination of low frequency with high bandwidth allows a variety of new military as well as civilian applications. In the frame of this thesis, several hardware and software modifications made in the E-SAR P-Band system operated by DLR aiming the improvement of the collected and processed data quality is described. The basic P-Band inherent problems like the low Signal-To-Noise-Ratio (SNR), the presence of Radio Frequency Interferences (RFI) as well as the high dynamic range of the backscattered signal are addressed. A new mode of operation called “Listen Only” (LO) channel mode gave us the unique opportunity to study and analyze the special characteristics of the interfering signals and the nature of the low frequency backscattered signal. Based on this analysis new RFI suppression algorithms have been developed and the system operation parameters have been set to the correct value resulting to high quality collected data. The effect of RFI signals in fully polarimetric SAR data processing and applications are analyzed in detail. One of the principal items of this thesis is the development of a new robust sub-aperture algorithm for improved Motion Compensation (MoCo) in wide azimuth beam SAR data processing. The new algorithm is incorporated to the Extended Chirp Scaling SAR data processing algorithm. The improved MoCo algorithm results to focused images with high SNR, contrast, higher resolution and better geometric correctness. The performance and the correction accuracy of the proposed algorithms are analyzed by using mainly real data collected by the E-SAR system of DLR.

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

Quantitative energy-filtered electron diffraction

1994 ◽  
Vol 52 ◽  
pp. 992-993
Author(s):  
R. Vincent
Keyword(s):  
Electron Diffraction ◽  
Inelastic Scattering ◽  
Dynamic Range ◽  
Electron Optics ◽  
Surface Layers ◽  
High Brightness ◽  
Inclined Surfaces ◽  
Perfect Symmetry ◽  
Amorphous Surface ◽  
The Ideal

Microanalysis and diffraction on a sub-nanometre scale have become practical in modern TEMs due to the high brightness of field emission sources combined with the short mean free paths associated with both elastic and inelastic scattering of incident electrons by the specimen. However, development of electron diffraction as a quantitative discipline has been limited by the absence of any generalised theory for dynamical inelastic scattering. These problems have been simplified by recent innovations, principally the introduction of spectrometers such as the Gatan imaging filter (GIF) and the Zeiss omega filter, which remove the inelastic electrons, combined with annual improvements in the speed of computer workstations and the availability of solid-state detectors with high resolution, sensitivity and dynamic range.Comparison of experimental data with dynamical calculations imposes stringent requirements on the specimen and the electron optics, even when the inelastic component has been removed. For example, no experimental CBED pattern ever has perfect symmetry, departures from the ideal being attributable to residual strain, thickness averaging, inclined surfaces, incomplete cells and amorphous surface layers.

Direct measurement of electron-diffraction-pattern intensities using an energy loss spectrometer

1989 ◽  
Vol 47 ◽  
pp. 668-669
Author(s):  
A. G. Jackson ◽  
M. Rowe
Keyword(s):  
Thermal Effects ◽  
Dynamic Range ◽  
Scattering Amplitude ◽  
Dynamical Theory ◽  
Site Symmetry ◽  
Proof Of Concept ◽  
Parallel Acquisition ◽  
Kinematic Approximation ◽  
Speed Up ◽  
Structure Calculations

Diffraction intensities from intermetallic compounds are, in the kinematic approximation, proportional to the scattering amplitude from the element doing the scattering. More detailed calculations have shown that site symmetry and occupation by various atom species also affects the intensity in a diffracted beam. [1] Hence, by measuring the intensities of beams, or their ratios, the occupancy can be estimated. Measurement of the intensity values also allows structure calculations to be made to determine the spatial distribution of the potentials doing the scattering. Thermal effects are also present as a background contribution. Inelastic effects such as loss or absorption/excitation complicate the intensity behavior, and dynamical theory is required to estimate the intensity value.The dynamic range of currents in diffracted beams can be 104or 105:1. Hence, detection of such information requires a means for collecting the intensity over a signal-to-noise range beyond that obtainable with a single film plate, which has a S/N of about 103:1. Although such a collection system is not available currently, a simple system consisting of instrumentation on an existing STEM can be used as a proof of concept which has a S/N of about 255:1, limited by the 8 bit pixel attributes used in the electronics. Use of 24 bit pixel attributes would easily allowthe desired noise range to be attained in the processing instrumentation. The S/N of the scintillator used by the photoelectron sensor is about 106 to 1, well beyond the S/N goal. The trade-off that must be made is the time for acquiring the signal, since the pattern can be obtained in seconds using film plates, compared to 10 to 20 minutes for a pattern to be acquired using the digital scan. Parallel acquisition would, of course, speed up this process immensely.

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