The energy-efficient circuits, though important in IoT and biomedical applications, are vulnerable to soft errors due to their low voltages and small node capacitances. This paper presents an energy-efficient low-area double-node-upset-hardened latch (EEDHL). The proposed latch enhances the radiation hardness by employing a restorer circuit based on a Muller C-element and a memory element. The post-layout simulations show that the EEDHL improves the area–energy–delay product (AEDP) by [Formula: see text]80% compared to the newly reported double-node-upset-resilient latch (DNURL) in STMicroelectronics 65-nm CMOS technology. Synopsys TCAD mixed-mode simulations in 32-nm CMOS technology framework are also used to validate the proposed DNU-hardened latch. The proposed EEDHL effectively mitigates the DNU at the strike with a linear energy transfer (LET) equal to 160[Formula: see text][Formula: see text]/mg in 32-nm CMOS technology.