Condition monitoring of 11kV porcelain pin insulator extracting surface current from total leakage current

2017 ◽  
Author(s):  
Suhas Deb ◽  
Riddhi Ghosh ◽  
Santu Dutta ◽  
Sovan Dalai ◽  
Biswendu Chatterjee
Keyword(s):  
Leakage Current ◽  
Condition Monitoring ◽  
Surface Current ◽  
Total Leakage

Surge Arrester Leakage Current Analysis by Using Particle Swarm Optimization Technique

2014 ◽  
Vol 554 ◽  
pp. 608-612
Author(s):  
Vahabi Mashak Saeed ◽  
Zulkurnain Abdul-Malek ◽  
Nabipour Afrouzi Hadi ◽  
Chin Leong Wooi ◽  
Amir Hesam Khavari
Keyword(s):  
Leakage Current ◽  
Condition Monitoring ◽  
Search Algorithm ◽  
Optimization Technique ◽  
Measurement Techniques ◽  
Particle Swarm ◽  
Operating Voltage ◽  
Surge Arresters ◽  
Particle Swarm Optimization Technique ◽  
Total Leakage

Surge arresters, as protective equipment, are used to limit any overvoltage in a power system resulting from various sources. The surge arrester affects from degradation due to the continuous operating voltage system as well as due to repeated lightning current discharge. Therefore, condition monitoring and health diagnostics of surge arresters are a necessary issue. Hence, as a feasible solution, a condition monitoring based on leakage current measurement techniques was selected to tackle the problem of age diagnostics of surge arresters. The Particle Swarm Search Algorithm was introduced as a method for extracting the third harmonic resistive component, Ir3rd, from the total leakage current. To employ this method for extracting Ir3rd, codes were developed in Matlab. The setting of Particle Swarm Search Algorithm was configured for extracting Ir3rd and accuracy of 94% was obtained.

scholarly journals Condition monitoring and deterioration analysis of metal oxide varistor

2018 ◽  
Vol 69 (5) ◽  
pp. 352-358 ◽  
Author(s):  
Guoming Wang ◽  
Woo-Hyun Kim ◽  
Jong-Hyuk Lee ◽  
Gyung-Suk Kil
Keyword(s):  
Metal Oxide ◽  
Leakage Current ◽  
Condition Monitoring ◽  
Low Voltage ◽  
Short Circuit ◽  
Harmonic Component ◽  
Accelerated Aging ◽  
Ground Fault ◽  
Total Leakage ◽  
Metal Oxide Varistor

Abstract With the growing demand for application of metal-oxide varistor (MOV) in low-voltage electronic circuits for overvoltage protection, it is necessary to ensure its performance to avoid the short-circuit and the line-to-ground fault during operation. In this paper, a precise leakage current analyzer was developed to detect the total leakage current and third harmonic component of MOV for its condition monitoring. The voltage- and temperature-dependent measuring uncertainties were compensated using the multipliers. In addition, the deterioration characteristics of the MOV and the newly developed thermally protected metal-oxide varistor (TMOV) were investigated in the accelerated aging test. From the experimental results, the MOV deteriorated much faster under the lightning current impulse synchronized with power-frequency voltage. The thermally activated fuse of TMOV exploded under two types of impulses, which indicated that the TMOV is much more vulnerable and that it is difficult to diagnose the condition of energized TMOV in advance.

Extraction of Defect in Doping Silicon Wafer by Analyzing the Lifetime Profile Method

2008 ◽  
Vol 55-57 ◽  
pp. 765-768
Author(s):  
W. Pengchan ◽  
T. Phetchakul ◽  
Amporn Poyai
Keyword(s):  
Leakage Current ◽  
Current Density ◽  
Cmos Technology ◽  
In Doping ◽  
Current Voltage ◽  
Capacitance Voltage ◽  
Total Leakage ◽  
Implantation Process ◽  
Generation Lifetime ◽  
Key Parameter

The total leakage current in silicon p-n junction diodes compatible with 0.8 µm CMOS technology is investigated. The generation lifetime is a key parameter for the leakage current, which can be obtained from the current-voltage (I-V) and the capacitance-voltage (C-V) characteristics. As will be shown, the electrically active defect from ion implantation process generated in p-n junction can be extracted from the generation current density.

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