Method of samples preparation intended for research of deep centers in i-, n-, and p-layers of GaAs p+-pin-n+ structures and result of analysis
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1983 ◽
Vol 30
(2)
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pp. 105-107
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2008 ◽
Vol 5
(6)
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pp. 1892-1894
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1978 ◽
pp. 570-580
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