TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm

Author(s):  
Grzegorz Mrugalski ◽  
Janusz Rajski ◽  
Jedrzej Solecki ◽  
Jerzy Tyszer ◽  
Chen Wang
Keyword(s):  
2018 ◽  
Author(s):  
Laurel G. Woodruff ◽  
◽  
Suzanne W. Nicholson ◽  
Connie L. Dicken ◽  
Klaus J. Schulz

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