An On-Chip Integrator Leakage Characterization Technique and Its Application to Switched Capacitor Circuits Testing

Author(s):  
Chen-Yuan Yang ◽  
Xuan-Lun Huang ◽  
Jiun-Lang Huang
2020 ◽  
Vol 117 (14) ◽  
pp. 144002
Author(s):  
Y. Xu ◽  
F. K. Unseld ◽  
A. Corna ◽  
A. M. J. Zwerver ◽  
A. Sammak ◽  
...  

1983 ◽  
Vol 71 (8) ◽  
pp. 915-916 ◽  
Author(s):  
G.C. Temes ◽  
Y. Tsividis

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