Identifying Non-Robust Untestable RTL Paths in Circuits with Multi-cycle Paths

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.55 ◽

2008 ◽

Author(s):

Thomas Edison Yu ◽

Tomokazu Yoneda ◽

Satoshi Ohtake ◽

Hideo Fujiwara

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