Identification of Suspicious Semiconductor Devices Using Independent Component Analysis with Dimensionality Reduction
2006 ◽
Vol 44
(6)
◽
pp. 1586-1600
◽
2012 ◽
Vol 23
(5)
◽
pp. 749-761
◽
2012 ◽
Vol 31
(6)
◽
pp. 2047-2060
◽
2017 ◽
Vol 8
(11)
◽
2019 ◽
Vol 13
(01)
◽
pp. 1
◽