Reducing the overkills and retests in wafer testing process

Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI ◽

10.1109/asmc.2003.1194508 ◽

2003 ◽

Cited By ~ 1

Author(s):

S.C. Horng ◽

S.Y. Lin ◽

M.H. Cheng ◽

F.Y. Yang ◽

C.H. Liu ◽

...

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