Advanced process control based on lithographic defect inspection and reduction

Author(s):  
J. Leavey ◽  
J. Boyle ◽  
A. Skumanich
2013 ◽  
Vol 2013 (1) ◽  
pp. 000799-000803
Author(s):  
Rajiv Roy

The trend towards 3D stacking and advanced packaging has significantly altered the requirements for manufacturing tools in the back-end. Techniques and processes being adopted are beginning to resemble the front-end of 20 years ago but with updated and more affordable cost-of ownership capabilities. As an example, 0.5um defect inspection would have been considered a front-end requirement 20 years ago. Today TSV and advanced packaging techniques such as fine-pitch RDL are demanding 0.5u level inspection but at perhaps 10x improvement in wafer throughput and 20x improvement in COO. Other Front-end capabilities ranging from metrology to Advanced Process Control (APC) that are being adopted by the back-end will also be discussed.


2016 ◽  
pp. 620-624
Author(s):  
Scott Kahre

Advanced process control technology can provide sugar processors the ability to realize major revenue enhancements and/or operating cost reductions with low initial investment. One technology in particular, model predictive control (MPC), holds the potential to increase production, reduce energy costs, and reduce quality variability in a wide variety of major sugar unit operations. These include centrifugal stations, pulp dryers, extractors, diffusers, mills, evaporating crystallizers, juice purification, and more. Simple payback periods as low as two months are projected. As a PC-based add-on to existing distributed control systems (DCS) or programmable logic controller (PLC) systems, MPC acts as a multi-input, multi-output controller, utilizing predictive process response models and optimization functions to control complex processes to their optimum cost and quality constraints.


2003 ◽  
Author(s):  
Lena Zavyalova ◽  
Chong-Cheng Fu ◽  
Gary S. Seligman ◽  
Perry A. Tapp ◽  
Victor Pol

2003 ◽  
Author(s):  
Timothy D. Stanley ◽  
Richard J. Markle ◽  
Brad Van Eck ◽  
Brian K. Cusson ◽  
Matthew A. Purdy ◽  
...  

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