Analysis of phase preservation for bistatic SAR interferometrie processing based on multiple phase center sampling

2015 ◽  
Author(s):  
You Yanan ◽  
Xu Huaping ◽  
Li Chunsheng ◽  
Zhang Lvqian
Keyword(s):  
Phase Center ◽  
Multiple Phase ◽  
Bistatic Sar

Multiple Phase Center Performance of Reflector Antennas Using a Dual Mode Horn

2006 ◽  
Vol 54 (11) ◽  
pp. 3407-3417 ◽  
Author(s):  
L. Shafai ◽  
S.K. Sharma ◽  
B. Balaji ◽  
A. Damini ◽  
G. Haslam
Keyword(s):  
Dual Mode ◽  
Reflector Antennas ◽  
Phase Center ◽  
Multiple Phase

Multiple phase transitions investigated by high-speed TEM

1990 ◽  
Vol 48 (4) ◽  
pp. 550-551
Author(s):  
Oleg Bostanjoglo ◽  
Peter Thomsen-Schmidt
Keyword(s):  
Phase Transitions ◽  
High Speed ◽  
Short Exposure ◽  
Semiconductor Film ◽  
Time Resolved ◽  
Short Exposure Time ◽  
Multiple Phase ◽  
Model Substance ◽  
History Of ◽  
Electron Image

Thin GexTe1-x (x = 0.15-0.8) were studied as a model substance of a composite semiconductor film, in addition being of interest for optical storage material. Two complementary modes of time-resolved TEM were used to trace the phase transitions, induced by an attached Q-switched (50 ns FWHM) and frequency doubled (532 nm) Nd:YAG laser. The laser radiation was focused onto the specimen within the TEM to a 20 μm spot (FWHM). Discrete intermediate states were visualized by short-exposure time doubleframe imaging /1,2/. The full history of a transformation was gained by tracking the electron image intensity with photomultiplier and storage oscilloscopes (space/time resolution 100 nm/3 ns) /3/. In order to avoid radiation damage by the probing electron beam to detector and specimen, the beam is pulsed in this continuous mode of time-resolved TEM,too.Short events ( <2 μs) are followed by illuminating with an extended single electron pulse (fig. 1c)

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