Characterization of the near-field and the far-field for a vertically radiating antenna over a ground plane.

2009 ◽  
Author(s):  
A. De ◽  
N. Yilmazer ◽  
T.K. Sarkar
Keyword(s):  
Near Field ◽  
Ground Plane ◽  
Far Field

scholarly journals Improved Handset Antenna Performance via an Electrically Extended Ground Plane

2012 ◽  
Vol 2012 ◽  
pp. 1-7 ◽  
Author(s):  
Shirook M. Ali ◽  
Huanhuan Gu ◽  
Kelce Wilson ◽  
James Warden
Keyword(s):  
Absorption Rate ◽  
Specific Absorption Rate ◽  
Near Field ◽  
Ground Plane ◽  
Practical Approach ◽  
Far Field ◽  
Specific Absorption ◽  
Antenna Performance ◽  
Field Patterns ◽  
Surface Metal

A novel and practical approach is presented providing improved antenna performance without enlarging the antenna or the ground plane. The approach electrically extends the ground plane using wire(s) that behave as surface metal extensions of the ground plane. The wire extensions can be accommodated within typical handset housing or as part of the stylish metal used on the handset’s exterior perimeter; hence don’t require enlargement of the device. Consequently, this approach avoids the costs and limitations traditionally associated with physically lengthening of a ground plane. Eight variations are presented and compared with baseline antenna performance. Both far-field patterns and near-field electromagnetic scans demonstrate that the proposed approach controls the electrical length of the ground plane and hence its chassis wavemodes, without negatively impacting the characteristics of the antenna. Improvements in performance of up to 56% in bandwidth at 900 MHz and up to 12% in efficiency with a reduction of up to 12% in the specific absorption rate (SAR) are achieved. An 8% increase in efficiency with a 1.3% improvement in bandwidth and a 20% reduction in SAR is achieved at 1880 MHz. Thus, improvements in bandwidth are achieved without compromising efficiency. Further, improvements at lower frequencies do not compromise performance at higher frequencies.

Miniaturized beamsplitters realized by X-ray waveguides

2016 ◽  
Vol 72 (5) ◽  
pp. 515-522 ◽  
Author(s):  
Sarah Hoffmann-Urlaub ◽  
Tim Salditt
Keyword(s):  
Interference Pattern ◽  
Phase Retrieval ◽  
Near Field ◽  
Retrieval Algorithm ◽  
Far Field ◽  
X Ray ◽  
Reconstructed Field ◽  
Propagation Methods ◽  
Cladding Material

This paper reports on the fabrication and characterization of X-ray waveguide beamsplitters. The waveguide channels were manufactured by electron-beam lithography, reactive ion etching and wafer bonding techniques, with an empty (air) channel forming the guiding layer and silicon the cladding material. A focused synchrotron beam is efficiently coupled into the input channel. The beam is guided and split into two channels with a controlled (and tunable) distance at the exit of the waveguide chip. After free-space propagation and diffraction broadening, the two beams interfere and form a double-slit interference pattern in the far-field. From the recorded far-field, the near-field was reconstructed by a phase retrieval algorithm (error reduction), which was found to be extremely reliable for the two-channel setting. By numerical propagation methods, the reconstructed field was then propagated along the optical axis, to investigate the formation of the interference pattern from the two overlapping beams. Interestingly, phase vortices were observed and analysed.

scholarly journals Near-field to far-field characterization of speckle patterns generated by disordered nanomaterials

2016 ◽  
Vol 24 (7) ◽  
pp. 7019 ◽  
Author(s):  
Valentina Parigi ◽  
Elodie Perros ◽  
Guillaume Binard ◽  
Céline Bourdillon ◽  
Agnès Maître ◽  
...  
Keyword(s):  
Near Field ◽  
Far Field ◽  
Speckle Patterns

Box-Scan: A Novel 3DXRD Method for Studies of Recrystallization and Grain Growth

2012 ◽  
Vol 715-716 ◽  
pp. 518-520 ◽  
Author(s):  
Allan Lyckegaard ◽  
Henning Friis Poulsen ◽  
Wolfgang Ludwig ◽  
Richard W. Fonda ◽  
Erik M. Lauridsen
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Polycrystalline Materials ◽  
High Temporal Resolution ◽  
Far Field ◽  
X Ray Diffraction ◽  
The Individual ◽  
Individual Grains ◽  
Non Destructive

Within the last decade a number of x-ray diffraction methods have been presented for non-destructive 3D characterization of polycrystalline materials. 3DXRD [1] and Diffraction Contrast Tomography [2,3,4] are examples of such methods providing full spatial and crystallographic information of the individual grains. Both methods rely on specially designed high-resolution near-field detectors for acquire the shape of the illuminated grains, and therefore the spatial resolution is for both methods limited by the resolution of the detector, currently ~2 micrometers. Applying these methods using conventional far-field detectors provides information on centre of mass, crystallographic orientation and stress state of the individual grains [5], at the expense of high spatial resolution. However, far-field detectors have much higher efficiency than near-field detectors, and as such are suitable for dynamic studies requiring high temporal resolution and set-ups involving bulky sample environments (e.g. furnaces, stress-rigs etc.)

Sign in / Sign up

Export Citation Format

Share Document