A W-band transition from coplanar waveguide to rectangular waveguide

2008 ◽  
Author(s):  
R. Shireen ◽  
S. Shi ◽  
P. Yao ◽  
C.A. Schuetz ◽  
J. Macario ◽  
...  
Keyword(s):  
Rectangular Waveguide ◽  
Coplanar Waveguide ◽  
W Band ◽  
Band Transition

Fully micromachined W-band rectangular waveguide to grounded coplanar waveguide transition

2012 ◽  
Vol 6 (5) ◽  
pp. 533 ◽  
Author(s):  
H. Aliakbarian ◽  
S. Radiom ◽  
V. Tavakol ◽  
P. Reynaert ◽  
B. Nauwelaers ◽  
...  
Keyword(s):  
Rectangular Waveguide ◽  
Coplanar Waveguide ◽  
Waveguide Transition ◽  
W Band

Full‐band transition from substrate integrated waveguide to rectangular waveguide

2015 ◽  
Vol 51 (14) ◽  
pp. 1089-1090 ◽  
Author(s):  
Hongyeal Lee ◽  
Sohyeun Yun ◽  
Manseok Uhm ◽  
Inbok Yom
Keyword(s):  
Rectangular Waveguide ◽  
Substrate Integrated Waveguide ◽  
Full Band ◽  
Band Transition

scholarly journals A Simplified Design Inline Microstrip-to-Waveguide Transition

Electronics ◽  
2018 ◽  
Vol 7 (10) ◽  
pp. 215 ◽  
Author(s):  
José Pérez-Escudero ◽  
Alicia Torres-García ◽  
Ramón Gonzalo ◽  
Iñigo Ederra
Keyword(s):  
Insertion Loss ◽  
Rectangular Waveguide ◽  
Return Loss ◽  
Intermediate Step ◽  
Analytical Design ◽  
Waveguide Transition ◽  
W Band

A simplified design of an inline transition between microstrip and rectangular waveguide is presented in this paper. The transition makes use of a dielectric filled rectangular waveguide (DFRW) as an intermediate step, which simplifies manufacturing and allows for an analytical design. The behavior of the transition has been experimentally validated in the W-band by means of a back-to-back configuration. Good performance has been achieved: a return loss greaterthan 10 dB and mean insertion loss lower than 1 dB.

Development of gallium-arsenide-based GCPW calibration kits for on-wafer measurements in the W-band

2019 ◽  
Vol 12 (5) ◽  
pp. 367-371
Author(s):  
Yibang Wang ◽  
Xingchang Fu ◽  
Aihua Wu ◽  
Chen Liu ◽  
Peng Luan ◽  
...  
Keyword(s):  
Gallium Arsenide ◽  
Coplanar Waveguide ◽  
Single Mode ◽  
Surface Mode ◽  
Wafer Level ◽  
Active Devices ◽  
W Band ◽  
Via Holes ◽  
Feasible Alternative ◽  
Calibration Techniques

AbstractWe present details of on-wafer-level 16-term error model calibration kits used for the characterization of W-band circuits based on a grounded coplanar waveguide (GCPW). These circuits were fabricated on a thin gallium arsenide (GaAs) substrate, and via holes, were utilized to ensure single mode propagation (i.e., eliminating the parallel-plate mode or surface mode). To ensure the accuracy of the definition for the calibration kits, multi-line thru-reflect-line (MTRL) assistant standards were also fabricated on the same wafer and measured. The same wafer also contained passive and active devices, which were measured subject to both 16-term and conventional line-reflect-reflect-match calibrations. Measurement results show that 16-term calibration kits are capable of determining the cross-talk more accurately. Other typical calibration techniques were also implemented using the standards on the GCPW calibration kits, and were compared with the MTRL calibration using a passive device under test. This revealed that the proposed GCPW GaAs calibration substrate could be a feasible alternative to conventional CPW impedance standard substrates, for on-wafer measurements at W-band and above.

Sign in / Sign up

Export Citation Format

Share Document