Near-field scattering characteristics of electrically large metallic plate in local illumination

2006 ◽  
Author(s):  
Ye-Hai Bi ◽  
Bing-Zhong Wang
Keyword(s):  
Near Field ◽  
Metallic Plate ◽  
Local Illumination

Writing 40-nm Marks Using a Beaked Metallic Plate Near-Field Optical Probe

2005 ◽  
Author(s):  
Takuya Matsumoto ◽  
Yumiko Anzai ◽  
Toshimichi Shintani ◽  
Kimio Nakamura ◽  
Tetsuya Nishida
Keyword(s):  
Near Field ◽  
Optical Probe ◽  
Metallic Plate

Highly efficient probe with a wedge-shaped metallic plate for high density near-field optical recording

2004 ◽  
Vol 95 (8) ◽  
pp. 3901-3906 ◽  
Author(s):  
T. Matsumoto ◽  
T. Shimano ◽  
H. Saga ◽  
H. Sukeda ◽  
M. Kiguchi
Keyword(s):  
Near Field ◽  
Optical Recording ◽  
High Density ◽  
Metallic Plate ◽  
Highly Efficient

scholarly journals Near-Field Periodic Subwavelength Holey Metallic Plate for Far-Field Superresolution Focusing

2017 ◽  
Vol 9 (1) ◽  
pp. 1-7 ◽  
Author(s):  
Xiao-Hua Wang ◽  
Min Hu ◽  
Bing-Zhong Wang ◽  
Gang Zheng ◽  
Peng Chen
Keyword(s):  
Near Field ◽  
Far Field ◽  
Metallic Plate

Writing 40 nm marks by using a beaked metallic plate near-field optical probe

2006 ◽  
Vol 31 (2) ◽  
pp. 259 ◽  
Author(s):  
T. Matsumoto ◽  
Y. Anzai ◽  
T. Shintani ◽  
K. Nakamura ◽  
T. Nishida
Keyword(s):  
Near Field ◽  
Optical Probe ◽  
Metallic Plate

Thermally assisted magnetic recording on a bit-patterned medium by using a near-field optical head with a beaked metallic plate

2008 ◽  
Vol 93 (3) ◽  
pp. 031108 ◽  
Author(s):  
Takuya Matsumoto ◽  
Kimio Nakamura ◽  
Tetsuya Nishida ◽  
Hiroyuki Hieda ◽  
Akira Kikitsu ◽  
...  
Keyword(s):  
Magnetic Recording ◽  
Near Field ◽  
Metallic Plate ◽  
Optical Head ◽  
Thermally Assisted Magnetic Recording

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Principles of Planar Near-Field Antenna Measurements

2007 ◽  
Author(s):  
Stuart Gregson ◽  
John McCormick ◽  
Clive Parini
Keyword(s):  
Near Field ◽  
Antenna Measurements
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