Metal-plate shorted T-shaped monopole for internal laptop antenna for 2.4/5 GHz WLAN operation

Author(s):  
Chih-Ming Su ◽  
Wen-Shyang Chen ◽  
Kin-Lu Wong
Keyword(s):  
2003 ◽  
Vol 39 (3) ◽  
pp. 246-249 ◽  
Author(s):  
Chih-Ming Su ◽  
Wen-Shyang Chen ◽  
Kin-Lu Wong
Keyword(s):  

2008 ◽  
Vol 50 (6) ◽  
pp. 1686-1687 ◽  
Author(s):  
Saou-Wen Su ◽  
Jui-Hung Chou
Keyword(s):  
Low Cost ◽  

2013 ◽  
Vol 51 (7) ◽  
pp. 535-545 ◽  
Author(s):  
Kwang-Seok Lee ◽  
Su-Eun Lee ◽  
Jung Su Kim ◽  
Min Jung Kim ◽  
Dong Hyun Bae ◽  
...  

2016 ◽  
Vol 12 (2) ◽  
pp. 4204-4212 ◽  
Author(s):  
Maheshwar Sharon ◽  
Ritesh Vishwakarma ◽  
Abhijeet Rajendra Phatak ◽  
Golap Kalita ◽  
Nallin Sharma ◽  
...  

Corn cob, an agricultural waste, is paralyzed at different temperatures (700oC, 800oC and 900oC). Microwave absorption of carbon in the frequency range of 2 GHz to 8 GHz is reported. Carbon activated  with 5%  nickel nitrate showed more than 90% absorption of microwave in the frequency range from 6 GHz to 8 GHz, while carbon activated  with 10% Nickel nitrate treated corn cob showed 90% absorption  in the frequency range of 2.5 GHz to 5 GHz. Carbon showing the best absorption are characterized by XRD, Raman spectra and SEM . It is suggested that corn cob treatment   alone with KOH did not improve the microwave absorption, whereas treatment along with nickel nitrate improved the absorption property much better. It is proposed that treatment with nickel nitrate helps in creating suitable pores in carbon   which improved the absorption behavior because while treating carbon with 1N HCl helps to leach out nickel creating equivalent amount of pores in the carbon.


Author(s):  
B.J. Cain ◽  
G.L. Woods ◽  
A. Syed ◽  
R. Herlein ◽  
Toshihiro Nomura

Abstract Time-Resolved Emission (TRE) is a popular technique for non-invasive acquisition of time-domain waveforms from active nodes through the backside of an integrated circuit. [1] State-of-the art TRE systems offer high bandwidths (> 5 GHz), excellent spatial resolution (0.25um), and complete visibility of all nodes on the chip. TRE waveforms are typically used for detecting incorrect signal levels, race conditions, and/or timing faults with resolution of a few ps. However, extracting the exact voltage behavior from a TRE waveform is usually difficult because dynamic photon emission is a highly nonlinear process. This has limited the perceived utility of TRE in diagnosing analog circuits. In this paper, we demonstrate extraction of voltage waveforms in passing and failing conditions from a small-swing, differential logic circuit. The voltage waveforms obtained were crucial in corroborating a theory for some failures inside an 0.18um ASIC.


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