Open-ended rectangular waveguides as antennas for measuring high loss dielectric materials at MM band

2003 ◽  
Author(s):  
Niu Maode ◽  
Shen Ying ◽  
Xu Deming
Keyword(s):  
Dielectric Materials ◽  
High Loss ◽  
Rectangular Waveguides

Dielectric measurement of high-loss liquids in rectangular waveguides

1965 ◽  
Vol 1 (1) ◽  
pp. 4 ◽  
Author(s):  
J.A. Staniforth ◽  
R.G. Bennett ◽  
J.H. Calderwood
Keyword(s):  
Dielectric Measurement ◽  
High Loss ◽  
Rectangular Waveguides

Broadband terahertz metamaterial absorber enabled by using high-loss dielectric materials

2019 ◽  
Vol 6 (10) ◽  
pp. 105804
Author(s):  
Ben-Xin Wang ◽  
Chao Tang ◽  
Qingshan Niu ◽  
Yuanhao He ◽  
Huaxin Zhu ◽  
...  
Keyword(s):  
Dielectric Materials ◽  
Metamaterial Absorber ◽  
High Loss ◽  
Broadband Terahertz

scholarly journals Field Representation Microwave Thermography Utilizing Lossy Microwave Design Materials

Sensors ◽  
2021 ◽  
Vol 21 (14) ◽  
pp. 4830
Author(s):  
Christoph Baer ◽  
Kerstin Orend ◽  
Birk Hattenhorst ◽  
Thomas Musch
Keyword(s):  
Fluid Dynamics ◽  
Electromagnetic Fields ◽  
Dielectric Materials ◽  
Thermal Camera ◽  
Field Representation ◽  
High Loss ◽  
Electromagnetic Heating ◽  
X Band ◽  
Simple Estimation ◽  
Microwave Design

In this contribution, we are investigating a technique for the representation of electromagnetic fields by recording their thermal footprints on an indicator material using a thermal camera. Fundamentals regarding the interaction of electromagnetic heating, thermodynamics, and fluid dynamics are derived which allow for a precise design of the field illustration method. The synthesis and description of high-loss dielectric materials is discussed and a technique for a simple estimation of the broadband material’s imaginary permittivity part is introduced. Finally, exemplifying investigations, comparing simulations and measurements on the fundamental TE10-mode in an X-band waveguide are presented, which prove the above introduced sensing theory.

Microstructural characterization of YBaCuO Films on LaAlO3 substrates

1989 ◽  
Vol 47 ◽  
pp. 180-181
Author(s):  
E. L. Hall ◽  
A. Mogro-Campero ◽  
N. Lewis ◽  
L. G. Turner
Keyword(s):  
Dielectric Constant ◽  
Single Crystal ◽  
Film Growth ◽  
Microstructural Characterization ◽  
Lattice Parameter ◽  
Film Plane ◽  
Substrate Material ◽  
High Loss ◽  
Amorphous Substrates ◽  
High Dielectric

There have been a large number of recent studies of the growth of Y-Ba-Cu-O thin films, and these studies have employed a variety of substrates and growth techniques. To date, the highest values of Tc and Jc have been found for films grown by sputtering or coevaporation on single-crystal SrTiO3 substrates, which produces a uniaxially-aligned film with the YBa2Cu3Ox c-axis normal to the film plane. Multilayer growth of films on the same substrate produces a triaxially-aligned film (regions of the film have their c-axis parallel to each of the three substrate <100> directions) with lower values of Jc. Growth of films on a variety of other polycrystalline or amorphous substrates produces randomly-oriented polycrystalline films with low Jc. Although single-crystal SrTiO3 thus produces the best results, this substrate material has a number of undesireable characteristics relative to electronic applications, including very high dielectric constant and a high loss tangent at microwave frequencies. Recently, Simon et al. have shown that LaAlO3 could be used as a substrate for YBaCuO film growth. This substrate is essentially a cubic perovskite with a lattice parameter of 0.3792nm (it has a slight rhombohedral distortion at room temperature) and this material exhibits much lower dielectric constant and microwave loss tangents than SrTiO3. It is also interesting from a film growth standpoint since it has a slightly smaller lattice parameter than YBa2Cu3Ox (a=0.382nm, b=c/3=0.389nm), while SrTiO3 is slightly larger (a=0.3905nm).

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