scholarly journals Multi-mode resonant control of a microcantilever for Atomic Force Microscopy

2013 ◽  
Author(s):  
Michael G. Ruppert ◽  
Matthew W. Fairbairn ◽  
S. O. Reza Moheimani
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resonant Control ◽  
Multi Mode

Nonlinear Multi-Mode Dynamics of a Microbeam for Noncontact Atomic Force Microscopy in Ultra-High Vacuum

2005 ◽  
Author(s):  
W. Wu ◽  
S. Pragai ◽  
O. Gottlieb
Keyword(s):  
Atomic Force Microscopy ◽  
High Vacuum ◽  
Closed Form Solution ◽  
Form Solution ◽  
Ultra High Vacuum ◽  
Atomic Interaction ◽  
Internal Resonances ◽  
Force Microscopy ◽  
Atomic Force ◽  
Multi Mode

We study the nonlinear multi-mode dynamics of a microbeam for noncontact atomic force microscopy in ultra-high vacuum. A boundary-value problem that includes a coupled linear thermo- and viscoelastic field with a localized nonlinear atomic interaction force, augmented by the linearized heat equation, is reduced to a modal dynamical system via Galerkin’s method. An equivalent linear thermoelastic quality factor is obtained and compared with a closed form solution. A numerically obtained escape curve defines valid operating parameters for low damping conditions. Primary, secondary and coupled internal resonances of a three-mode system are examined to reveal a rich bifurcation structure.

scholarly journals Energy dissipation in multifrequency atomic force microscopy

2014 ◽  
Vol 5 ◽  
pp. 494-500 ◽  
Author(s):  
Valentina Pukhova ◽  
Francesco Banfi ◽  
Gabriele Ferrini
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Dissipated Energy ◽  
Flexural Mode ◽  
Force Microscopy ◽  
Analysis Techniques ◽  
Atomic Force ◽  
General Relevance ◽  
Multi Mode ◽  
Mode Atomic Force Microscopy

The instantaneous displacement, velocity and acceleration of a cantilever tip impacting onto a graphite surface are reconstructed. The total dissipated energy and the dissipated energy per cycle of each excited flexural mode during the tip interaction is retrieved. The tip dynamics evolution is studied by wavelet analysis techniques that have general relevance for multi-mode atomic force microscopy, in a regime where few cantilever oscillation cycles characterize the tip–sample interaction.

Multi-Mode Q Control in Multifrequency Atomic Force Microscopy

2015 ◽  
Author(s):  
Michael G. Ruppert ◽  
S. O. Reza Moheimani
Keyword(s):  
Atomic Force Microscopy ◽  
Flexible Structures ◽  
Pole Placement ◽  
Full Potential ◽  
Q Factor ◽  
Control Approach ◽  
Force Microscopy ◽  
Bimodal Imaging ◽  
Atomic Force ◽  
Multi Mode

Various Atomic Force Microscopy (AFM) modes have emerged which rely on the excitation and detection of multiple eigenmodes of the microcantilever. The conventional control loops employed in multifrequency AFM (MF-AFM) such as bimodal imaging where the fundamental mode is used to map the topography and a higher eigenmode is used to map sample material properties only focus on maintaining low bandwidth signals such as amplitude and/or frequency shift. However, the ability to perform additional high bandwidth control of the quality (Q) factor of the participating modes is believed to be imperative to unfolding the full potential of these methods. This can be achieved by employing a multi-mode Q control approach utilizing positive position feedback. The controller exhibits remarkable performance in arbitrarily modifying the Q factor of multiple eigenmodes as well as guaranteed stability properties when used on flexible structures with collocated actuators and sensors. A controller design method based on pole placement optimization is proposed for setting an arbitrary on-resonance Q factor of the participating eigenmodes. Experimental results using bimodal AFM imaging on a two component polymer sample are presented.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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