Nano-vibration characteristics of a piezoelectric plate wirelessly driven by electric field

2009 ◽  
Author(s):  
Satyanarayan Bhuyan ◽  
Junhui Hu
Keyword(s):  
Electric Field ◽  
Piezoelectric Plate ◽  
Vibration Characteristics

Wireless drive of piezoelectric plate by focused electric field

2007 ◽  
Vol 91 (26) ◽  
pp. 264101 ◽  
Author(s):  
Satyanarayan Bhuyan ◽  
Junhui Hu
Keyword(s):  
Electric Field ◽  
Piezoelectric Plate ◽  
Focused Electric Field

Developing a matrix of lateral electric field excited resonators on a piezoelectric plate

2015 ◽  
Vol 79 (10) ◽  
pp. 1283-1287 ◽  
Author(s):  
I. A. Borodina ◽  
B. D. Zaitsev ◽  
I. E. Kuznetsova ◽  
A. A. Teplykh ◽  
A. M. Shikhabudinov
Keyword(s):  
Electric Field ◽  
Piezoelectric Plate ◽  
Lateral Electric Field

Nonlinear Acoustoelastic Interactions of Lamb Waves with LiNbO3 Films Deposited on Sapphire Substrates

2004 ◽  
Vol 261-263 ◽  
pp. 263-268 ◽  
Author(s):  
H. Liu ◽  
K.C. Shin ◽  
J.J. Lee ◽  
Z.M. Cai
Keyword(s):  
Electric Field ◽  
Acoustic Waves ◽  
Lamb Waves ◽  
Piezoelectric Plate ◽  
Surface Acoustic Waves ◽  
Bias Field ◽  
Film Structure ◽  
Voltage Sensors ◽  
Sapphire Substrates ◽  
Piezoelectric Structure

The influence of a biasing electric field on the propagation of the lowest-order antisymmetrical a0 Lamb wave modes in a bi-layered piezoelectric plate is investigated in this paper. It is found that the velocity shifts for the a0 mode due to presence of the bias field on the 10- µm LiNbO3 film structure are comparable with those observed in surface acoustic waves and Lamb waves in LiNbO3 plates. The fractional change in phase velocity of the layered piezoelectric structure is a linear function of the biasing electric field and can be used in voltage sensors.

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

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