scholarly journals Development of Effective Methods for Structural Image Recognition Using the Principles of Data Granulation and Apparatus of Fuzzy Logic

IEEE Access ◽  
2021 ◽  
Vol 9 ◽  
pp. 13417-13428
Author(s):  
Yousef Ibrahim Daradkeh ◽  
Iryna Tvoroshenko ◽  
Volodymyr Gorokhovatskyi ◽  
Liza Abdul Latiff ◽  
Norulhusna Ahmad
Author(s):  
Faiez Musa Lahmood Alrufaye ◽  
Mohammed Muanis I. Al-Sagheer ◽  
Marwah Thamer Ali

Image processing has become one of the most important branches of computer science, especially after entering into several areas of life such as medicine, engineering and various sciences. In our current research, we have developed a system of image recognition based on image characteristics and some content information using the most important artificial intelligence algorithms, a fuzzy logic algorithm, to obtain complete image information using small values ranging from 0 to 1. The program was executed on a set of standard database called the WANG database. It holds the contents of 1000 images from the Corel stock photo database, in JPEG format. The system was evaluated using the recall method. This method calculates the proportion of correct results identified by the system as correct results with correct result identified by the classic system.


2015 ◽  
Vol 74 (6) ◽  
pp. 503-514
Author(s):  
V. A. Gorokhovatsky ◽  
O.A. Kobylin ◽  
Yu.A. Kulikov

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 95197-95207
Author(s):  
Adebamigbe Fasanmade ◽  
Ying He ◽  
Ali H. Al-Bayatti ◽  
Jarrad Neil Morden ◽  
Suleiman Onimisi Aliyu ◽  
...  

Author(s):  
J.L. Batstone ◽  
J.M. Gibson ◽  
Alice.E. White ◽  
K.T. Short

High resolution electron microscopy (HREM) is a powerful tool for the determination of interface atomic structure. With the previous generation of HREM's of point-to-point resolution (rpp) >2.5Å, imaging of semiconductors in only <110> directions was possible. Useful imaging of other important zone axes became available with the advent of high voltage, high resolution microscopes with rpp <1.8Å, leading to a study of the NiSi2 interface. More recently, it was shown that images in <100>, <111> and <112> directions are easily obtainable from Si in the new medium voltage electron microscopes. We report here the examination of the important Si/Si02 interface with the use of a JEOL 4000EX HREM with rpp <1.8Å, in a <100> orientation. This represents a true structural image of this interface.


2012 ◽  
Author(s):  
Thomas M. Crawford ◽  
Justin Fine ◽  
Donald Homa
Keyword(s):  

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