Piezoelectric scanners for atomic force microscopes: design of lateral sensors, identification and control

Proceedings of the 1999 American Control Conference (Cat. No. 99CH36251) ◽

10.1109/acc.1999.782779 ◽

1999 ◽

Cited By ~ 41

Keyword(s):

Atomic Force Microscopes ◽

Atomic Force ◽

And Control

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A Tutorial on the Mechanisms, Dynamics, and Control of Atomic Force Microscopes

2007 American Control Conference ◽

10.1109/acc.2007.4282300 ◽

2007 ◽

Cited By ~ 109

Author(s):

Daniel Y. Abramovitch ◽

Sean B. Andersson ◽

Lucy Y. Pao ◽

Georg Schitter

Keyword(s):

Atomic Force Microscopes ◽

Atomic Force ◽

Dynamics And Control ◽

And Control

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Design and control of atomic force microscopes

Proceedings of the 2003 American Control Conference, 2003. ◽

10.1109/acc.2003.1240412 ◽

2004 ◽

Cited By ~ 4

Author(s):

O.M. El Rifai ◽

K. Youcef-Toumi

Keyword(s):

Atomic Force Microscopes ◽

Atomic Force ◽

And Control

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Design and Control of a Dual-Probe Atomic Force Microscope

IEEE/ASME Transactions on Mechatronics ◽

10.1109/tmech.2017.2779241 ◽

2018 ◽

Vol 23 (1) ◽

pp. 424-433 ◽

Cited By ~ 5

Author(s):

Muthukumaran Loganathan ◽

Ayad Al-Ogaidi ◽

Douglas A. Bristow

Keyword(s):

Atomic Force Microscope ◽

Atomic Force ◽

And Control ◽

Dual Probe

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Geometry distortions of nanostructure edges scanned with amplitude-modulated atomic force microscopes

Measurement Science and Technology ◽

10.1088/0957-0233/24/11/115008 ◽

2013 ◽

Vol 24 (11) ◽

pp. 115008 ◽

Cited By ~ 1

Author(s):

Dorothee Hüser ◽

Wolfgang Häßler-Grohne ◽

Jonathan Hüser

Keyword(s):

Atomic Force Microscopes ◽

Atomic Force

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Low latency demodulation for Atomic Force Microscopes, Part I efficient real-time integration

Proceedings of the 2011 American Control Conference ◽

10.1109/acc.2011.5991144 ◽

2011 ◽

Cited By ~ 14

Author(s):

Daniel Y. Abramovitch

Keyword(s):

Real Time ◽

Time Integration ◽

Low Latency ◽

Atomic Force Microscopes ◽

Atomic Force

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Scratch direction and threshold force in nanoscale scratching using atomic force microscopes

Applied Surface Science ◽

10.1016/j.apsusc.2011.04.065 ◽

2011 ◽

Vol 257 (22) ◽

pp. 9243-9250 ◽

Cited By ~ 32

Author(s):

Ampere A. Tseng ◽

Chung-Feng Jeffrey Kuo ◽

Shyankay Jou ◽

Shinya Nishimura ◽

Jun-ichi Shirakashi

Keyword(s):

Atomic Force Microscopes ◽

Threshold Force ◽

Atomic Force

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On factors affecting the performance of atomic force microscopes in contact-mode

1999 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (Cat. No.99TH8399) ◽

10.1109/aim.1999.803137 ◽

1999 ◽

Cited By ~ 2

Author(s):

O.M. El Rifai ◽

K. Youcef-Toumi

Keyword(s):

Contact Mode ◽

Factors Affecting ◽

Atomic Force Microscopes ◽

Atomic Force

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Investigation of position detectors for atomic force microscopes

Measurement Science and Technology ◽

10.1088/1361-6501/aad397 ◽

2018 ◽

Vol 29 (10) ◽

pp. 105101 ◽

Cited By ~ 3

Author(s):

Nataliya Vorbringer-Dorozhovets ◽

Rostyslav Mastylo ◽

Eberhard Manske

Keyword(s):

Atomic Force Microscopes ◽

Atomic Force

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Design and control of multi-actuated atomic force microscope for large-range and high-speed imaging

Ultramicroscopy ◽

10.1016/j.ultramic.2015.10.016 ◽

2016 ◽

Vol 160 ◽

pp. 213-224 ◽

Cited By ~ 12

Author(s):

I. Soltani Bozchalooi ◽

A. Careaga Houck ◽

J.M. AlGhamdi ◽

K. Youcef-Toumi

Keyword(s):

Atomic Force Microscope ◽

High Speed ◽

Large Range ◽

High Speed Imaging ◽

Atomic Force ◽

And Control

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Interaction force measurements using atomic force microscopy for characterization and control of adhesion, dispersion and lubrication in particulate

Atomic Force Microscopy in Adhesion Studies ◽

10.1201/b12164-17 ◽

2005 ◽

pp. 55-56

Keyword(s):

Atomic Force Microscopy ◽

Interaction Force ◽

Force Measurements ◽

Force Microscopy ◽

Atomic Force ◽

And Control

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