Investigation of high-temperature degradation of platinum thin films with an in situ resistance measurement apparatus

1998 ◽  
Vol 7 (1) ◽  
pp. 128-135 ◽  
Author(s):  
S.L. Firebaugh ◽  
K.F. Jensen ◽  
M.A. Schmidt
Author(s):  
H.M. Appelboom ◽  
J.P. Adriaanse ◽  
H.I. de Groot ◽  
G. Rietveld ◽  
D. van der Marel ◽  
...  

2001 ◽  
Vol 206-213 ◽  
pp. 775-778 ◽  
Author(s):  
Gert Roebben ◽  
Chao Zhao ◽  
Ren-Guan Duan ◽  
Jef Vleugels ◽  
Marc M. Heyns ◽  
...  

2007 ◽  
Vol 40 (2) ◽  
pp. 332-337 ◽  
Author(s):  
R. Guinebretière ◽  
A. Boulle ◽  
R. Bachelet ◽  
O. Masson ◽  
P. Thomas

A laboratory X-ray diffractometer devoted to thein situcharacterization of the microstructure of epitaxic thin films at temperatures up to 1500 K has been developed. The sample holder was built using refractory materials, and a high-accuracy translation stage allows correction of the dilatation of both the sample and the sample holder. The samples are oriented with respect to the primary beam with two orthogonal rotations allowing the registration of symmetric as well as asymmetric reciprocal space maps (RSMs). The association of a monochromatic primary beam and a position-sensitive detector allows the measurement of RSMs in a few minutes for single crystals and in a few hours for imperfect epitaxic thin films. A detailed description of the setup is given and its potential is illustrated by high-temperature RSM experiments performed on yttria-doped zirconia epitaxic thin films grown on sapphire substrates.


1990 ◽  
Vol 164-165 ◽  
pp. 407-413 ◽  
Author(s):  
H.M. Appelboom ◽  
J.P. Adriaanse ◽  
H.I. de Groot ◽  
G. Rietveld ◽  
D. van der Marel ◽  
...  

2004 ◽  
Vol 30 (7) ◽  
pp. 2019-2022
Author(s):  
S.M. Sim ◽  
B.J. Chen ◽  
X.W. Sun

2013 ◽  
Vol 494 ◽  
pp. 148-152 ◽  
Author(s):  
Timing Qu ◽  
Yunran Xue ◽  
Feng Feng ◽  
Rongxia Huang ◽  
Wei Wu ◽  
...  

1994 ◽  
Vol 235-240 ◽  
pp. 649-650 ◽  
Author(s):  
J. García López ◽  
J.C.Cheang Wong ◽  
J. Siejka ◽  
L.M. Mercandalli ◽  
R. Bisaro

1991 ◽  
Vol 27 (2) ◽  
pp. 1013-1016 ◽  
Author(s):  
H.M. Appelboom ◽  
J.P. Adriaanse ◽  
A.W. Fortuin ◽  
H.I. de Groot ◽  
S.M. Verbrugh ◽  
...  

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