Wave diffraction by a rough boundary of an arbitrary plane-layered medium

2001 ◽  
Vol 49 (4) ◽  
pp. 630-639 ◽  
Author(s):  
I.M. Fuks
Keyword(s):  
Wave Diffraction ◽  
Layered Medium ◽  
Rough Boundary ◽  
Arbitrary Plane

Wave diffraction by rough interfaces in an arbitrary plane-layered medium

2000 ◽  
Vol 10 (2) ◽  
pp. 253-272 ◽  
Author(s):  
Iosif M Fuks ◽  
Alexander G Voronovich
Keyword(s):  
Wave Diffraction ◽  
Layered Medium ◽  
Arbitrary Plane ◽  
Rough Interfaces

Standing wave diffraction with a beam of slow atoms

1997 ◽  
Vol 44 (10) ◽  
pp. 1863-1882 ◽  
Author(s):  
S. KUNZE , S. DURR, K. DIECKMANN , M.
Keyword(s):  
Standing Wave ◽  
Wave Diffraction

A SEMI-ANALYTICAL METHOD FOR SOLVING INVERSE PROBLEMS OF WAVE DIFFRACTION BY INHOMOGENEOUS LAYERS

2015 ◽  
Vol 74 (11) ◽  
pp. 945-969 ◽  
Author(s):  
A. V. Brovenko ◽  
N.P. Melezhik ◽  
P. N. Melezhik ◽  
A.Yu. Poyedinchuk ◽  
Alexey A. Vertiy
Keyword(s):  
Inverse Problems ◽  
Wave Diffraction ◽  
Analytical Method

SH-Wave Scattering From the Interface Defect

2017 ◽  
Vol 5 (1) ◽  
pp. 45-50
Author(s):  
Myron Voytko ◽  
◽  
Yaroslav Kulynych ◽  
Dozyslav Kuryliak
Keyword(s):  
Half Space ◽  
Wave Diffraction ◽  
Scattered Field ◽  
Wave Scattering ◽  
Elastic Layer ◽  
Analytical Form ◽  
Structure Parameters ◽  
Sh Wave ◽  
Interface Defect ◽  
Hopf Method

The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.

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