Angular bandpass filters: an alternative viewpoint gives improved design flexibility

1995 ◽  
Vol 43 (4) ◽  
pp. 390-395 ◽  
Author(s):  
D. Kinowski ◽  
M. Guglielmi ◽  
A.G. Roederer
Keyword(s):  
Bandpass Filters ◽  
Design Flexibility ◽  
Improved Design

Maskless liquid-crystal-display projection photolithography for improved design flexibility of cellular micropatterns

Biomaterials ◽  
2006 ◽  
Vol 27 (15) ◽  
pp. 3005-3009 ◽  
Author(s):  
Kazuyoshi Itoga ◽  
Jun Kobayashi ◽  
Masayuki Yamato ◽  
Akihiko Kikuchi ◽  
Teruo Okano
Keyword(s):  
Liquid Crystal ◽  
Liquid Crystal Display ◽  
Design Flexibility ◽  
Improved Design

Class of miniaturised/arbitrary power division ratio couplers with improved design flexibility

2015 ◽  
Vol 9 (10) ◽  
pp. 1066-1073 ◽  
Author(s):  
Mohammad Mahdi Honari ◽  
Rashid Mirzavand ◽  
Pedram Mousavi ◽  
Abdolali Abdipour
Keyword(s):  
Arbitrary Power ◽  
Division Ratio ◽  
Design Flexibility ◽  
Improved Design

scholarly journals Improved design flexibility of open robot cells through tool-center-point monitoring

Procedia CIRP ◽  
2021 ◽  
Vol 100 ◽  
pp. 295-300
Author(s):  
Christian Deuerlein ◽  
Fabian Müller ◽  
Julian Seßner ◽  
Peter Heß ◽  
Jörg Franke
Keyword(s):  
Design Flexibility ◽  
Center Point ◽  
Improved Design

An improved design for an Scanning Tunnelling Microscope (STM) for use in a Transmission Electron Microscope (TEM)

1991 ◽  
Vol 49 ◽  
pp. 384-385
Author(s):  
W.K. Lo ◽  
J.C.H. Spence
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Mechanical Stability ◽  
Scanning Tunnelling Microscope ◽  
Reflection Mode ◽  
Specimen Holder ◽  
Transmission Electron ◽  
Scanning Tunnelling ◽  
Improved Design

An improved design for a combination Scanning Tunnelling Microscope/TEM specimen holder is presented. It is based on earlier versions which have been used to test the usefulness of such a device. As with the earlier versions, this holder is meant to replace the standard double-tilt specimen holder of an unmodified Philips 400T TEM. It allows the sample to be imaged simultaneously by both the STM and the TEM when the TEM is operated in the reflection mode (see figure 1).The resolution of a STM is determined by its tip radii as well as its stability. This places strict limitations on the mechanical stability of the tip with respect to the sample. In this STM the piezoelectric tube scanner is rigidly mounted inside the endcap of the STM holder. The tip coarse approach to the sample (z-direction) is provided by an Inchworm which is located outside the TEM vacuum.

Spurious Suppression Effect by Transmit Bandpass Filters with HTS Dual-Mode Resonators for 5GHz Band

2009 ◽  
Vol E92-C (3) ◽  
pp. 288-295
Author(s):  
Kazunori YAMANAKA ◽  
Kazuaki KURIHARA ◽  
Akihiko AKASEGAWA ◽  
Masatoshi ISHII ◽  
Teru NAKANISHI
Keyword(s):  
Bandpass Filters ◽  
Dual Mode ◽  
Suppression Effect ◽  
Spurious Suppression

Investigation of HTS Microstrip Bandpass Filters for Extreme Working Conditions

2002 ◽  
Vol 57 (12) ◽  
pp. 6
Author(s):  
I. V. Korotash ◽  
M. Lorenz ◽  
E.M. Rudenko ◽  
T.V. Stepanova
Keyword(s):  
Working Conditions ◽  
Bandpass Filters
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