Textured buffer layers for YBCO coated conductors by continuous sol-gel processing

2001 ◽  
Vol 11 (1) ◽  
pp. 2889-2892 ◽  
Author(s):  
H. Okuyucu ◽  
E. Celik ◽  
M.K. Ramazanoglu ◽  
Y. Akin ◽  
I.H. Mutlu ◽  
...  
2015 ◽  
Vol 77 (1) ◽  
pp. 94-99 ◽  
Author(s):  
Weibai Bian ◽  
Yuanqing Chen ◽  
Xinni Tang ◽  
Weihua Zhang ◽  
Gaoyang Zhao ◽  
...  

2003 ◽  
Vol 13 (2) ◽  
pp. 2669-2672 ◽  
Author(s):  
E. Celik ◽  
Y. Akin ◽  
W. Sigmund ◽  
Y.S. Hascicek

2002 ◽  
Vol 17 (6) ◽  
pp. 1543-1549 ◽  
Author(s):  
S. Sathyamurthy ◽  
M. Paranthaman ◽  
T. Aytug ◽  
B. W. Kang ◽  
P. M. Martin ◽  
...  

Sol-gel processing of La2Zr2O7 (LZO) buffer layers on biaxially textured Ni–1.7% Fe–3% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effects of increasing the annealing speed on the texture, microstructure, and carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of yttria-stabilized zirconia and Ceria (CeO2) were deposited using rf sputtering, and YBa2Cu3Ox (YBCO) films were then deposited using pulsed laser deposition. Critical current densities (Jc) of 1.9 MA/cm2 at 77 K and self-field and 0.34 MA/cm2at 77 K and 0.5 T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers and the highest ever obtained using solution seed layers.


2003 ◽  
Vol 47 (12) ◽  
pp. 2171-2175 ◽  
Author(s):  
Y. Akin ◽  
Z.K. Heiba ◽  
W. Sigmund ◽  
Y.S. Hascicek

2006 ◽  
Vol 21 (3) ◽  
pp. 767-773 ◽  
Author(s):  
M.S. Bhuiyan ◽  
M. Paranthaman ◽  
A. Goyal ◽  
L. Heatherly ◽  
D.B. Beach

Epitaxial films of rare-earth (RE = La, Ce, Eu, and Gd) tantalates, RE3TaO7 with pyrochlore structures were grown on biaxially textured nickel-3 at.% tungsten (Ni-W) substrates using chemical solution deposition (CSD) process. Precursor solution of 0.3∼0.4 M concentration of total cations were spin coated on to short samples of Ni-W substrates and the films were crystallized at 1050∼1100 °C in a gas mixture of Ar- 4% H2 for 15 to 60 min. X-ray studies show that the films of pyrochlore RE tantalate films are highly textured with cube-on-cube epitaxy. Improved texture was observed in case of lanthanum tantalate (La3TaO7) film grown on Ni-W substrates. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) investigations of RE3TaO7 films reveal a fairly dense and smooth microstructure without cracks and porosity. The rare-earth tantalate layers may be potentially used as buffer layers for YBa2Cu3O7-δ (YBCO) coated conductors.


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