Reduction of low frequency excess noise and temperature drift of SQUIDs by "degaussing" using high frequency magnetic fields

1997 ◽  
Vol 7 (2) ◽  
pp. 3263-3266 ◽  
Author(s):  
M. Muck ◽  
S. Schone ◽  
C. Heiden
Keyword(s):  
Magnetic Fields ◽  
High Frequency ◽  
Low Frequency ◽  
Excess Noise ◽  
Temperature Drift

Weak nonlinear electromagnetic waves and low-frequency magnetic-field generation in electron-positron-ion plasmas

1988 ◽  
Vol 40 (2) ◽  
pp. 289-298 ◽  
Author(s):  
F. B. Rizzato
Keyword(s):  
Magnetic Fields ◽  
High Frequency ◽  
Electromagnetic Waves ◽  
Low Frequency ◽  
Spontaneous Generation ◽  
Magnetic Field Generation ◽  
Frequency Wave ◽  
Weakly Nonlinear ◽  
Nonlinear Localization ◽  
Electron Positron

The weakly nonlinear localization of obliquely modulated high-frequency electromagnetic waves in an electron-positron-ion plasma is considered. It is shown that the amplitude of the wave turns out to be a strongly dependent function of the angle between the slow modulations and the fast spatial variations and that the possibility appears of spontaneous generation of low-frequency magnetic fields. These magnetic fields are also functions of this angle and of the high-frequency wave polarization. The analysis of colinear modulation in electron-positron plasmas shows that some restriction must be made regarding the validity of previous calculations.

scholarly journals A Topological Model of the Solar Magnetic Field Reversals

1991 ◽  
Vol 130 ◽  
pp. 234-236
Author(s):  
E.E. Benevolenskaya
Keyword(s):  
Magnetic Field ◽  
Magnetic Fields ◽  
High Frequency ◽  
Low Frequency ◽  
Frequency Component ◽  
High Frequency Component ◽  
Time Interval ◽  
Solar Cycles ◽  
Polarity Reversals ◽  
Odd Cycles

The phenomenon of a three-fold reversal of the solar polar magnetic field in both hemispheres has not been observed during the last 115 years. Such three-fold reversals took place in the southern hemisphere alone in the even cycles Nos 12 (1885.8), 14 (1908.4) and in the northern hemisphere alone in solar cycles Nos 16 (1928.5), 18 (1949.0), 20 (1970.6). The single reversal took place in the odd cycles, the only exception is the solar cycle No 19 (Fig. 1).There are periods of 1.7-2.5 years in the variation of background magnetic fields (Makarov et al., 1985). It determines the quasi-period of the high-frequency component and corresponds to a time interval between the zones of alternating polarity of the magnetic field. This enables us to show topologically that single and three-fold polarity reversals of the solar magnetic fields can result from interaction of two types of magnetic fields: a low-frequency component with period of the order of 20 years and a high frequency component with period of order of 1.7-2.5 years (Benevolenskaya and Makarov, 1990).

Low frequency excess noise measurements in high frequency polysilicon emitter bipolar transistors

1999 ◽  
Vol 43 (4) ◽  
pp. 729-740 ◽  
Author(s):  
Jean Marc Routoure ◽  
Jacques Lepaisant ◽  
Daniel Bloyet ◽  
Serge Bardy ◽  
Christelle Biard ◽  
...  
Keyword(s):  
High Frequency ◽  
Low Frequency ◽  
Bipolar Transistors ◽  
Excess Noise ◽  
Noise Measurements ◽  
Polysilicon Emitter

The kinetic theory of the nonlinear low-frequency response of a collisionless plasma to high-frequency electromagnetic radiation

1992 ◽  
Vol 48 (1) ◽  
pp. 167-176 ◽  
Author(s):  
Yu. M. Aliev ◽  
V. Yu. Bychenkov ◽  
M. S. Jovanović ◽  
A. A. Frolov
Keyword(s):  
Magnetic Fields ◽  
Kinetic Theory ◽  
Electromagnetic Radiation ◽  
High Frequency ◽  
Collisionless Plasma ◽  
Low Frequency ◽  
Electric And Magnetic Fields ◽  
Ponderomotive Forces ◽  
Current Densities ◽  
Low Frequency Motion

A kinetic theory of nonlinear currents, quasi-stationary electric and magnetic fields and the ponderomotive effect of high-frequency electromagnetic radiation on a collisionless plasma is developed. General expressions for nonlinear current densities, fields and ponderomotive forces that are applicable in a broad range of space-time scales, characteristie of low-frequency motion in plasma, are obtained. These expressions are compared with the results of previous papers.

Practical High Resolution Microscopy

1968 ◽  
Vol 26 ◽  
pp. 302-303
Author(s):  
P. A. Marsh ◽  
T. Mullens ◽  
D. Price
Keyword(s):  
High Resolution ◽  
Magnetic Fields ◽  
Low Frequency ◽  
Resolving Power ◽  
Careful Attention ◽  
Electron Microscopes ◽  
The Relationship ◽  
High Resolution Microscopy ◽  
New Facilities

It is possible to exceed the guaranteed resolution on most electron microscopes by careful attention to microscope parameters essential for high resolution work. While our experience is related to a Philips EM-200, we hope that some of these comments will apply to all electron microscopes.The first considerations are vibration and magnetic fields. These are usually measured at the pre-installation survey and must be within specifications. It has been our experience, however, that these factors can be greatly influenced by the new facilities and therefore must be rechecked after the installation is completed. The relationship between the resolving power of an EM-200 and the maximum tolerable low frequency interference fields in milli-Oerstedt is 10 Å - 1.9, 8 Å - 1.4, 6 Å - 0.8.

Simulations of high-resolution images of amorphous silicon films

1986 ◽  
Vol 44 ◽  
pp. 544-545
Author(s):  
G. Y. Fan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscope ◽  
High Frequency ◽  
Fourier Transformation ◽  
Amorphous Materials ◽  
Low Frequency ◽  
Chromatic Aberration ◽  
Structure Information ◽  
Frequency Components ◽  
High Resolution Images ◽  
Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

SEM image sharpness analysis

1996 ◽  
Vol 54 ◽  
pp. 142-143
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
High Frequency ◽  
Low Frequency ◽  
Quantitative Information ◽  
Primary Electron ◽  
Image Sharpness ◽  
Critical Dimensions ◽  
Sem Image ◽  
Frequency Changes ◽  
Electron Microscopes ◽  
Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

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