Current-voltage characteristics of shunted Josephson weak links with excess current

1995 ◽  
Vol 5 (2) ◽  
pp. 2527-2530 ◽  
Author(s):  
R.G. Seed ◽  
C. Vittoria ◽  
A. Widom
Keyword(s):  
Weak Links ◽  
Excess Current ◽  
Current Voltage ◽  
Current Voltage Characteristics

6H(n+)/3C(n)/6H(p+) - SiC Structures Grown by Sublimation Epitaxy

2005 ◽  
Vol 108-109 ◽  
pp. 713-716 ◽  
Author(s):  
Anatoly M. Strel'chuk ◽  
Alexander A. Lebedev ◽  
A.E. Cherenkov ◽  
Alexey N. Kuznetsov ◽  
Alla S. Tregubova ◽  
...  
Keyword(s):  
Quantum Well ◽  
Free Exciton ◽  
High Current ◽  
Excess Current ◽  
Forward Current ◽  
Current Voltage ◽  
Barrier Type ◽  
Current Voltage Characteristics ◽  
Exciton Annihilation ◽  
Injection Electroluminescence

Investigation of the multilayer 6H(n+)/3C(n)/6H(p+)-SiC heterostructure grown by sublimation epitaxy show that the injection electroluminescence (IEL) in the green region (hνmax≈2.30-2.35eV) of spectrum is dominant. This band is close to the electroluminescence peak due to defects in 6H-SiC but also can be due to free exciton annihilation in a quantum well in 3C-SiC at the 6H/3C-SiC heterointerface. At high current the IEL peak at hνmax≈2.9 eV is found. This peak (and also two another peaks in blue part of spectra: hνmax≈2.6 eV and hνmax≈2.72 eV) can be attributed to recombination in 6H-SiC. The forward current-voltage characteristics for best structures are close to those for ideal 6H-SiC pn homostructure and characterized by abrupt breakdown. A lot of structures are characterized by barrier type excess current. Structure in the region of evident 3C-SiC inclusion is characterized by high forward and reverse excess currents.

scholarly journals Current-voltage characteristics of semiconductor-coupled superconducting weak links with large electrode separations

1998 ◽  
Vol 58 (17) ◽  
pp. 11676-11684 ◽  
Author(s):  
Mason Thomas ◽  
Hans-Richard Blank ◽  
Ki C. Wong ◽  
Herbert Kroemer ◽  
Evelyn Hu
Keyword(s):  
Weak Links ◽  
Current Voltage ◽  
Current Voltage Characteristics

Superfluid Density in Ultrathin YBCO Films

2000 ◽  
Vol 659 ◽  
Author(s):  
Lyuba A. Delimova ◽  
Igor V. Grekhov ◽  
Ivan A. Liniichuk ◽  
Ivan A. Veselovsky ◽  
Konstantin B. Traito ◽  
...  
Keyword(s):  
Superfluid Density ◽  
Transport Current ◽  
Weak Links ◽  
Transition Model ◽  
Resistive State ◽  
Resistive Transition ◽  
Current Increase ◽  
Ybco Films ◽  
Current Voltage ◽  
Current Voltage Characteristics

ABSTRACTWe studied the transition of 8 nm-thick YBCO films deposited with and without YBaCuNbO buffer from the superconducting to resistive state due to the temperature or transport current increase. For both film types, the current –voltage characteristics and resistive transition followed the Kosterlitz-Thouless transition model. The superfluid densities were found from the Kosterlitz-Thouless transition temperature TKT to be about 3% and 1.3% of the total carrier density in YBCO with and without buffer, respectively. We believe that the low superfluid densities indicate the presence of weak links in the film.

scholarly journals A new theory of the current-voltage characteristics of weak links

Physica ◽  
1971 ◽  
Vol 55 ◽  
pp. 405-412 ◽  
Author(s):  
J. Clarke ◽  
A.B. Pippard ◽  
J.R. Waldram
Keyword(s):  
Weak Links ◽  
Current Voltage ◽  
Current Voltage Characteristics

Effect of Neutron Irradiation on Current-Voltage Characteristics of Packaged Diodes Based on 6H-SiC pn Structures

2017 ◽  
Vol 897 ◽  
pp. 459-462 ◽  
Author(s):  
Anatoly M. Strel'chuk ◽  
V.T. Gromov ◽  
Viktor V. Zelenin ◽  
A.N. Kuznetsov ◽  
Alexander A. Lebedev ◽  
...  
Keyword(s):  
Neutron Irradiation ◽  
Carrier Lifetime ◽  
Series Resistance ◽  
Nonequilibrium Carrier ◽  
Excess Current ◽  
Current Voltage ◽  
Partial Suppression ◽  
Current Voltage Characteristics ◽  
Recombination Current

Neutron irradiation (~1 MeV, dose 1014-5.6∙1015 neutron/cm2) of packaged diodes based on 6H-SiC pn structures (with the base n-layer doped to ~5∙1016 cm-3) has been studied. In addition to the well-known rise in the series resistance of the diodes, the effect of a partial suppression of the excess current in both forward-and reverse-biased diodes and that of an increase in the recombination current, probably associated with the decrease in the nonequilibrium carrier lifetime, were discovered and discussed. These effects are common to 6H-and 4H-SiC pn structures.

scholarly journals Theory of the current-voltage characteristics of SNS junctions and other superconducting weak links

1970 ◽  
Vol 268 (1188) ◽  
pp. 265-287 ◽  
Keyword(s):  
Phase Locking ◽  
Current Source ◽  
Voltage Source ◽  
Weak Links ◽  
Detailed Calculation ◽  
Flux Flow ◽  
Step Structure ◽  
Current Voltage ◽  
Current Voltage Characteristics ◽  
Density Equation

A theory of the current-voltage characteristics of superconducting-normal-superconducting junctions is proposed. The theory is based on a simple model current-density equation. The form of the currentvoltage characteristic is found to depend critically on whether the electrical source should be treated as a current source or a voltage source at high frequencies. A picture is given of the dynamical state of a junction at finite voltage, and all the important differences between the characteristics observed for SNS junctions and tunnel junctions are explained at least qualitatively. In particular, the theory covers the cases of a junction wide enough to be limited by its own field and the step structure known to be induced by an applied h.f. field. For wide junctions the predicted behaviour is an exactly calculable quantized flux flow in one dimension. It is the phase-locking of this flux flow by the applied h.f. field which leads to the step structure. A detailed calculation of the rounding of the steps by noise is given; the steps are predicted to be exceedingly steep. The theory is compared with the theories of other superconducting weak links.

A Model Analysis for Current-Voltage Characteristics of Superconducting Weak Links

1997 ◽  
Vol 36 (Part 2, No. 3A) ◽  
pp. L272-L275 ◽  
Author(s):  
Kazuo Saitoh ◽  
Yoshihiro Ishimaru ◽  
Hiroyuki Fuke ◽  
Youichi Enomoto
Keyword(s):  
Model Analysis ◽  
Weak Links ◽  
Current Voltage ◽  
Current Voltage Characteristics
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