Surface resistance measurements of HTS films by means of sapphire dielectric resonators

1993 ◽  
Vol 3 (3) ◽  
pp. 3043-3048 ◽  
Author(s):  
J. Krupka ◽  
M. Klinger ◽  
M. Kuhn ◽  
A. Baryanyak ◽  
M. Stiller ◽  
...  
Keyword(s):  
Surface Resistance ◽  
Dielectric Resonators ◽  
Hts Films

Microwave surface resistance measurement of hts films using dielectric resonators

2006 ◽  
Vol 449 (2) ◽  
pp. 96-99 ◽  
Author(s):  
X. Zhang ◽  
S.L. Yan ◽  
L. Ji ◽  
D.Y. Sun ◽  
T.G. Zhou ◽  
...  
Keyword(s):  
Surface Resistance ◽  
Resistance Measurement ◽  
Dielectric Resonators ◽  
Microwave Surface Resistance ◽  
Hts Films

Demonstration of surface resistance mapping of large-area HTS films using the dielectric resonator method

2003 ◽  
Vol 383 (4) ◽  
pp. 374-378 ◽  
Author(s):  
M Kusunoki ◽  
Y Takano ◽  
K Nakamura ◽  
M Inadomaru ◽  
D Kosaka ◽  
...  
Keyword(s):  
Dielectric Resonator ◽  
Surface Resistance ◽  
Large Area ◽  
Resonator Method ◽  
Hts Films

Surface resistance and nonlinear dynamic microwave losses of epitaxial HTS films

1997 ◽  
Vol 7 (2) ◽  
pp. 1236-1239 ◽  
Author(s):  
W. Diete ◽  
M. Getta ◽  
M. Hein ◽  
T. Kaiser ◽  
G. Muller ◽  
...  
Keyword(s):  
Nonlinear Dynamic ◽  
Surface Resistance ◽  
Microwave Losses ◽  
Hts Films

Optimum Configuration of the Antenna to the Dielectric Resonator to Measure the Accurate Surface Resistance of the HTS Films

2000 ◽  
pp. 1069-1071 ◽  
Author(s):  
Momoko Inadomaru ◽  
Daisuke Kousaka ◽  
Masanobu Kusunoki ◽  
Masashi Mukaida ◽  
Shigetoshi Ohshima
Keyword(s):  
Dielectric Resonator ◽  
Surface Resistance ◽  
Optimum Configuration ◽  
Hts Films

Temperature and dc magnetic field dependence of the surface resistance in HTS films

2005 ◽  
Vol 426-431 ◽  
pp. 1606-1610 ◽  
Author(s):  
A. Saito ◽  
M. Shirakawa ◽  
K. Kitamura ◽  
Y. Noguchi ◽  
M. Mukaida ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Field Dependence ◽  
Surface Resistance ◽  
Magnetic Field Dependence ◽  
Dc Magnetic Field ◽  
Hts Films

SOME PECULIARITIES OF USING OF DIELECTRIC RESONATORS IN MICROWAVE SURFACE IMPEDANCE MEASUREMENTS

2009 ◽  
Vol 23 (20n21) ◽  
pp. 4473-4480
Author(s):  
T. NURGALIEV
Keyword(s):  
Surface Impedance ◽  
Dielectric Resonator ◽  
Surface Resistance ◽  
Metal Films ◽  
Dielectric Resonators ◽  
Impedance Measurements ◽  
Geometry Factor ◽  
Microwave Surface Impedance ◽  
Layer Structures ◽  
Thin Superconductor

A simple equivalent circuit of the dielectric resonator technique, using for measurement of the surface resistance of the samples of non-standard dimensions, was considered and analyzed. It was shown that the coefficient (the geometry factor) relating the surface resistance of the sample to the quality factor may be different in the cases when the inductive resistance (caused by the external inductance) of the sample exceeds significantly its active resistance and when these resistances are of the same order. It was shown too, that an anomaly in the RS versus T dependence (i.e., a decreasing of the surface resistance with increase of the temperature) is possible in double layer structures with thin superconductor and metal films.

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