A 105-GHz bandwidth optical-to-electrical conversion stimulus probe head employing a unitraveling-carrier photodiode

1999 ◽  
Vol 11 (8) ◽  
pp. 1033-1035 ◽  
Author(s):  
T. Otsuji ◽  
N. Sahri ◽  
N. Shimizu ◽  
T. Nagatsuma ◽  
T. Ishibashi
Keyword(s):  
Author(s):  
Chunlei Wu ◽  
Suying Yao

Abstract Lock-in IR-OBIRCH analysis, as a kind of static thermal laser stimulation (S-TLS) technique, is very effective to isolate a fault for the parametric failure cases. However, its capability is limited to localize a defect when the IC is operated under a defined operating condition. Whereas the dynamic thermal laser stimulation (D-TLS) technique is good at locating a fault while the IC is operated under some functions to activate the failure. In this paper, a novel method is presented to realize DTLS just by Lock-in IR-OBIRCH assisted with a Current Detection Probe Head. Two cases are studied to demonstrate the effectiveness of this method.


Author(s):  
Hung-Sung Lin ◽  
Mong-Sheng Wu

Abstract The use of a scanning probe microscope (SPM), such as a conductive atomic force microscope (C-AFM) has been widely reported as a method of failure analysis in nanometer scale science and technology [1-6]. A beam bounce technique is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam used for a beam bounce also gives rise to the photoelectric effect while we are measuring the electrical characteristics of a device, such as a pn junction. In this paper, the photocurrent for a device caused by photon illumination was quantitatively evaluated. In addition, this paper also presents an example of an application of the C-AFM as a tool for the failure analysis of trap defects by taking advantage of the photoelectric effect.


Author(s):  
Y.-N. Rao ◽  
G.H. Mackenzie ◽  
T. Ries
Keyword(s):  

2016 ◽  
Vol 6 (5) ◽  
pp. 144 ◽  
Author(s):  
Adam Gąska ◽  
Piotr Gąska ◽  
Maciej Gruza

2021 ◽  
Author(s):  
Krzysztof Stepien ◽  
Urszula Kmiecik-Sołtysiak ◽  
Anna Zawada-Tomkiewicz ◽  
Uros Zuperl

Abstract One of the most universal measuring techniques in contemporary industry is a coordinate measuring technique. This paper focuses on a problem of measurements of form deviations with the use of coordinate measuring machines (CMMs). Nowadays, such measurements are usually carried out using a scanning probe-heads. The paper discusses the problem of measurements of roundness deviations by a scanning probe-head. Authors conducted an experiment aiming at the study of the influence of the number of probing points and the scanning speed on parameters of roundness error. The results were compared to the reference values obtained from the radius change instrument for highly accurate roundness and cylindricity measurements. The paper presents the introduction to the problem, the methodology of the study, the results of the experiment, discussion and final conclusions including the plan of further research.


Sign in / Sign up

Export Citation Format

Share Document