Narrow-band light source with acoustooptic tunable filter for optical low-coherence reflectometry

1996 ◽  
Vol 8 (5) ◽  
pp. 658-660 ◽  
Author(s):  
K. Takada ◽  
H. Yamada
Keyword(s):  
Light Source ◽  
Narrow Band ◽  
Tunable Filter ◽  
Low Coherence ◽  
Optical Low Coherence Reflectometry

Ultra-Narrow Band Tunable Filter

2005 ◽  
Author(s):  
Balam A. Willemsen
Keyword(s):  
Narrow Band ◽  
Tunable Filter

Light source for low-coherence interferometry surface diagnostics

2011 ◽  
Author(s):  
Zdeněk Buchta ◽  
Bretislav Mikel ◽  
Simon Rerucha ◽  
Josef Lazar ◽  
Ondrej Cip
Keyword(s):  
Light Source ◽  
Low Coherence ◽  
Low Coherence Interferometry ◽  
Surface Diagnostics

Low Coherence Interferometry for Non-Invasive Semiconductor Monitoring

1993 ◽  
Vol 324 ◽  
Author(s):  
Chris M. Lawson ◽  
Robert R. Michael
Keyword(s):  
Solar Cell ◽  
Manufacturing Processes ◽  
Growth Monitoring ◽  
Low Coherence ◽  
Non Invasive ◽  
Low Coherence Interferometry ◽  
Silicon Growth ◽  
Silicon Thickness ◽  
Efficient Solar Cell ◽  
Optical Low Coherence Reflectometry

AbstractWe report on the first use of optical low coherence reflectometry (OLCR) for Edge Defined Film-Fed Growth (EFG) silicon characterization. This OLCR sensor system has been used to measure horizontal profiles of silicon thickness and flatness to an accuracy of 1.5 Rim with the sensor head positioned 1 cm away from the silicon. The use of this noninvasive sensor for EFG silicon growth monitoring may lead to more efficient solar cell manufacturing processes.

scholarly journals Geometry Monitoring of Rotating Parts of Power Unit with an Adapted Doppler Preprocessor

2021 ◽  
Vol 2057 (1) ◽  
pp. 012091
Author(s):  
D V Kulikov ◽  
S V Dvoynishnikov ◽  
V V Rahmanov ◽  
V A Pavlov ◽  
I K Kabardin
Keyword(s):  
Signal Processing ◽  
Semiconductor Laser ◽  
Light Source ◽  
Power Unit ◽  
Laser Diode ◽  
Semiconductor Laser Diode ◽  
Low Coherence ◽  
Signal Processing Algorithms ◽  
Processing Algorithms ◽  
Dynamic Shape

Abstract Current work is devoted to the development of a device for monitoring the dynamic shape of a power unit. The work is based on the FMCW method. The light source uses a low-coherence semiconductor laser diode. Signal processing is performed on an adapted Doppler processor. The paper describes the methods, hardware and signal processing algorithms.

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