scholarly journals High precision planar waveguide propagation loss measurement technique using a Fabry-Perot cavity

1994 ◽  
Vol 6 (10) ◽  
pp. 1244-1247 ◽  
Author(s):  
T. Feuchter ◽  
C. Thirstrup
Keyword(s):  
High Precision ◽  
Measurement Technique ◽  
Planar Waveguide ◽  
Propagation Loss ◽  
Loss Measurement ◽  
Waveguide Propagation ◽  
Fabry Perot

Waveguide propagation-loss measurement technique

1987 ◽  
Vol 12 (12) ◽  
pp. 1047 ◽  
Author(s):  
R. Arsenault ◽  
D. Gregoris ◽  
S. Woolven ◽  
V. M. Ristic
Keyword(s):  
Measurement Technique ◽  
Propagation Loss ◽  
Loss Measurement ◽  
Waveguide Propagation

Optical waveguide propagation loss measurement using multiple reflections method

2005 ◽  
Vol 256 (1-3) ◽  
pp. 68-72 ◽  
Author(s):  
Shaowu Chen ◽  
Qingfeng Yan ◽  
Qingyang Xu ◽  
Zhongchao Fan ◽  
Jingwei Liu
Keyword(s):  
Optical Waveguide ◽  
Propagation Loss ◽  
Multiple Reflections ◽  
Loss Measurement ◽  
Waveguide Propagation

The Effects of Composition on the Spectral Loss Characteristics of SiGe Planar Waveguide Structures

1992 ◽  
Vol 281 ◽  
Author(s):  
Yang Zuoya ◽  
B. L. Weiss ◽  
G. Shao ◽  
F. Namavar
Keyword(s):  
Optical Properties ◽  
Planar Waveguide ◽  
Waveguide Structure ◽  
Propagation Loss ◽  
Band Edge ◽  
Optical Confinement ◽  
Structural And Optical Properties ◽  
Edge Absorption

ABSTRACTThe effect of the Si:Ge ratio in SiGe/Si heterostructures on the structural and optical properties of SiGe/Si planar waveguide are reported here for Ge concentrations from 1 to 33.6%. The high propagation loss at 1.15 pm is due to band edge absorption, which increases as the Ge concentration increases, while the loss at longer wavelengths (1.523 pm) increases with decreasing Si concentration, due to the reduced optical confinement of the waveguide structure.

Electro-optic Mach-Zehnder modulators with polycrystalline BaTiO3 thin films on MgO

2002 ◽  
Vol 748 ◽  
Author(s):  
A. Petraru ◽  
J. Schubert ◽  
M. Schmid ◽  
O. Trithaveesak ◽  
Ch. Buchal
Keyword(s):  
Thin Films ◽  
Growth Temperature ◽  
Ion Beam ◽  
Growth Conditions ◽  
Propagation Loss ◽  
Ion Beam Etching ◽  
Waveguide Propagation ◽  
Electro Optic ◽  
Ridge Waveguides ◽  
Waveguide Modulators

ABSTRACTThe optical and electro-optical properties of epitaxially grown thin films of ferroelectric BaTiO3 on MgO substrates have been established and high quality Mach-Zehnder waveguide modulators have been demonstrated. As a next step towards the integration of ferroelectric thin films on different substrates, we have modified the growth conditions by lowering the growth temperature to study polycrystalline, but still highly transparent BaTiO3 (BTO) films. Polycrystalline BTO on MgO substrates has been grown by pulsed laser deposition (PLD). The growth temperature was reduced from 800 °C to 400 °C at an oxygen pressure of 2×10-3 mbar. Although polycrystalline, the BTO is still birefringent with no= 2.32 and ne = 2.30. Ridge waveguides have been formed by ion beam etching. The estimated waveguide propagation loss is 4 dB/cm at 633 nm. Electro-optic Mach-Zehnder modulators have been realized. Using 3 mm long electrodes with a spacing of 10 μm, a Vπ voltage of 14 V was obtained at 633 nm wavelength. This is half of the observed effective electro-optic coefficient measured at epitaxial BTO films. At 1.5 μm wavelength similar results were observed.

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