FeRAM retention analysis method based on memory cell read signal voltage measurement
2002 ◽
Vol 15
(2)
◽
pp. 201-208
◽
2020 ◽
Vol 29
(13)
◽
pp. 2050206
◽
Keyword(s):
Multiple phase-transition in Ge2Sb2Te5 based phase change memory cell by current–voltage measurement
2007 ◽
Vol 353
(44-46)
◽
pp. 4043-4047
◽
Keyword(s):
2017 ◽
Vol 4
(1)
◽
pp. 12-22