High-speed avionic optical fiber CDMA networks

1999 ◽  
Vol 14 (6) ◽  
pp. 15-21 ◽  
Author(s):  
Jian-Guo Zhang
Keyword(s):  
Optical Fiber ◽  
High Speed ◽  
Cdma Networks

High speed optical switching gain based EDFA model with 30 Gb/s NRZ modulation code in optical systems

2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Mahmoud M. A. Eid ◽  
Ahmed Nabih Zaki Rashed ◽  
Keyword(s):  
Optical Fiber ◽  
High Speed ◽  
Optical Switching ◽  
Fiber Amplifier ◽  
Optical Systems ◽  
Power Budget ◽  
Erbium Doped Fiber Amplifier ◽  
Amplifier Model ◽  
Modulation Rate ◽  
Modulation Code

AbstractThis study presents high speed optical switching gain based Erbium doped fiber amplifier model. By using the proposed model the optical fiber loss can be minimized. The system is stabilized with the power budget of 25.875 mW a long 75 km as a length of optical fiber in this study can be verified. The modulation rate of 10 Gb/s can be upgrade up to reach 30 Gb/s. The suitable power for the optical transmitter is −2.440 dBm and NRZ modulation code is verified. The receiver sensitivity can be upgraded with the minimum bit error rate and max Q factor are 1.806 e−009 and 5.899.

Ripple Technique; a Novel Non-Contact Wafer Emissivity and Temperature Method for RTP

1991 ◽  
Vol 224 ◽  
Author(s):  
C. Schietinger ◽  
B. Adams ◽  
C. Yarling
Keyword(s):  
Optical Fiber ◽  
Measurement Technique ◽  
Thermal Processing ◽  
High Speed ◽  
Rapid Thermal Processing ◽  
Wafer Surface ◽  
Speed Measurement ◽  
Temperature Method ◽  
Emissivity Measurement ◽  
Emissivity Measurements

AbstractA novel wafer temperature and emissivity measurement technique for rapid thermal processing (RTP) is presented. The ‘Ripple Technique’ takes advantage of heating lamp AC ripple as the signature of the reflected component of the radiation from the wafer surface. This application of Optical Fiber Thermometry (OFT) allows high speed measurement of wafer surface temperatures and emissivities. This ‘Ripple Technique’ is discussed in theoretical and practical terms with wafer data presented. Results of both temperature and emissivity measurements are presented for RTP conditions with bare silicon wafers and filmed wafers.

Multipulse-Per-Row Codes for High-Speed Optical Wavelength/Time CDMA Networks

2007 ◽  
Vol 19 (21) ◽  
pp. 1756-1758 ◽  
Author(s):  
Chao-Chin Yang ◽  
Jen-Fa Huang ◽  
Yi-Hsien Wang
Keyword(s):  
High Speed ◽  
Optical Wavelength ◽  
Cdma Networks

Effect of Draw Furnace Geometry on High Speed Optical Fiber Manufacturing

2000 ◽  
Author(s):  
Xu Cheng ◽  
Yogesh Jaluria
Keyword(s):  
Heat Transfer ◽  
Temperature Distribution ◽  
Optimal Design ◽  
Optical Fiber ◽  
High Speed ◽  
Graphite Furnace ◽  
Large Diameter ◽  
High Volume ◽  
Force Balance ◽  
Zonal Method

Abstract The motivation of manufacturers to pursue higher productivity and low costs in the fabrication of optical fibers requires large diameter silica-based preforms drawn into fiber at very high speed. An optimal design of the draw furnace is particularly desirable to meet the need of high-volume production in the optical fiber industry. This paper investigates optical fiber drawing at high draw speeds in a cylindrincal graphite furnace. A conjugate problem involving the glass and the purge gases is considered. The transport in the two regions is coupled through the boundary conditions at the free glass surface. The zonal method is used to model the radiative heat transfer in the glass. The neck-down profile of the preform at steady state is determined by a force balance, using an iterative numerical scheme. Thermally induced defects are also considered. To emphasize the effects of draw furnace geometry, the diameters of the preform and the fiber are kept fixed at 5 cm and 125 μm, respectively. The length and the diameter of the furnace are changed. For the purposes of comparison, a wide domain of draw speeds, ranging from 5 m/s to 20 m/s, is considered, and the form of the temperature distribution at the furnace surface is kept unchanged. The dependence of the preform/fiber characteristics, such as neckdown profile, velocity distribution and lag, temperature distribution and lag, heat transfer coefficent, defect concentration, and draw tension, on the furnace geometry is determined. Based on these numerical results, an optimal design of the draw furnace can be developed.

Sign in / Sign up

Export Citation Format

Share Document