Military applications of high accuracy frequency standards and clocks

1993 ◽  
Vol 40 (5) ◽  
pp. 522-527 ◽  
Author(s):  
J.R. Vig
Keyword(s):  
High Accuracy ◽  
Frequency Standards ◽  
Military Applications

scholarly journals High-accuracy frequency standards using laser-cooled Hg+ ions

1998 ◽  
Author(s):  
Dana J. Berkeland ◽  
J. D. Miller ◽  
Brent C. Young ◽  
James C. Bergquist ◽  
Wayne M. Itano ◽  
...  
Keyword(s):  
High Accuracy ◽  
Frequency Standards

scholarly journals 40Ca+ optical frequency standards with high accuracy

2018 ◽  
Vol 67 (16) ◽  
pp. 164202
Author(s):  
Guan Hua ◽  
Huang Yao ◽  
Li Cheng-Bin ◽  
Gao Ke-Lin
Keyword(s):  
High Accuracy ◽  
Optical Frequency ◽  
Frequency Standards

A New 1,000 kV Electron Microscope

1967 ◽  
Vol 25 ◽  
pp. 260-261
Author(s):  
M. Nishigaki ◽  
S. Katagiri ◽  
H. Kimura ◽  
B. Tadano
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Basic Research ◽  
Chromatic Aberration ◽  
High Accuracy ◽  
Biological Specimen ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.

Failure Analysis With the Scanning Electron Microscope

1972 ◽  
Vol 30 ◽  
pp. 482-483
Author(s):  
John R. Devaney
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Integrated Circuits ◽  
Failure Analysis ◽  
High Reliability ◽  
Military Applications ◽  
Small Structure ◽  
Useful Life ◽  
Insight Into ◽  
Scanning Electron

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.

The long-term instability of the new generation hydrogen masers

2020 ◽  
pp. 35-38
Author(s):  
S.I. Donchenko ◽  
I.Y. Blinov ◽  
I.B. Norets ◽  
Y.F. Smirnov ◽  
A.A. Belyaev ◽  
...  
Keyword(s):  
Time Scale ◽  
Frequency Difference ◽  
Clock Frequency ◽  
Quantum Frequency ◽  
Frequency Standards ◽  
Quantum Frequency Standards ◽  
New Generation ◽  
Atomic Time

The latest changes in the algorithm for the formation of the international atomic time scale TAI are reported in terms of estimating the weights of the clocks involved in the formation of TAI. Studies of the characteristics of the long-term instability of new-generation hydrogen masers based on processing the results of the clock frequency difference with respect to TAI are performed. It has been confirmed that at present, new-generation hydrogen masers show significantly less long-term instability in comparison with quantum frequency standards ofsimilar and other types.

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