An experimental determination of electron drift velocity in 0.5- mu m gate-length ion-implanted GaAs MESFET's

1991 ◽  
Vol 12 (2) ◽  
pp. 40-41 ◽  
Author(s):  
M. Feng ◽  
C.L. Lau ◽  
V. Eu
2000 ◽  
Vol 21 (10) ◽  
pp. 485-487 ◽  
Author(s):  
K.V. Vassilevski ◽  
K. Zekentes ◽  
A.V. Zorenko ◽  
L.P. Romanov

1985 ◽  
Vol 24 (Part 1, No. 11) ◽  
pp. 1573-1574 ◽  
Author(s):  
Tadao Ishibashi ◽  
Yuhki Imai ◽  
Masao Idda

1986 ◽  
Vol 29 (12) ◽  
pp. 1295-1296 ◽  
Author(s):  
Chian S. Chang ◽  
Harold R. Fetterman

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