A new method of determination of the I-V characteristics of negative differential conductance devices by microwave reflection coefficient measurements
1986 ◽
Vol 29
(9)
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pp. 947-950
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2007 ◽
Vol 91
(2-3)
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pp. 137-142
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1963 ◽
Vol 49
(6)
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pp. 788-788
Keyword(s):
1980 ◽
Vol 85
◽
pp. 249-250
Keyword(s):
1972 ◽
Vol 33
(11)
◽
pp. 2161-2166
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Keyword(s):