Hot-carrier effects on interface-trap capture cross sections in MOSFETs as studied by charge pumping

1992 ◽  
Vol 13 (4) ◽  
pp. 201-202 ◽  
Author(s):  
W. Chen ◽  
A. Balasinski ◽  
B. Zhang ◽  
T.-P. Ma
Keyword(s):  
Cross Sections ◽  
Interface Trap ◽  
Capture Cross ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Effects ◽  
Capture Cross Sections

THERMAL NEUTRON CAPTURE CROSS-SECTION OF Na23 AND Mn55

1953 ◽  
Vol 31 (3) ◽  
pp. 204-206 ◽  
Author(s):  
Rosalie M. Bartholomew ◽  
R. C. Hawkings ◽  
W. F. Merritt ◽  
L. Yaffe
Keyword(s):  
Thermal Neutron ◽  
Cross Section ◽  
Cross Sections ◽  
Neutron Capture ◽  
Half Life ◽  
Capture Cross Section ◽  
Thermal Neutron Capture ◽  
Capture Cross ◽  
Neutron Capture Cross Section ◽  
Capture Cross Sections

The thermal neutron capture cross sections of Na23 and Mn55 have been determined using the activation method. The values are 0.53 ± 0.03 and 12.7 ± 0.3 barns respectively with respect to σAul97 = 93 barns. These agree well with recent pile oscillator results. The half-life for Mn56 is found to be 2.576 ± 0.002 hr.

Capture Cross Sections for Negative Ions in Rotating Helium II

1965 ◽  
Vol 14 (15) ◽  
pp. 585-587 ◽  
Author(s):  
B. E. Springett ◽  
D. J. Tanner ◽  
R. J. Donnelly
Keyword(s):  
Cross Sections ◽  
Negative Ions ◽  
Capture Cross ◽  
Helium Ii ◽  
Capture Cross Sections
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