Characterization and simulation of proton exchanged integrated optical modulators with various dielectric buffer layers

1991 ◽  
Vol 9 (1) ◽  
pp. 92-100 ◽  
Author(s):  
W. Charczenko ◽  
P.S. Weitzman ◽  
H. Klotz ◽  
M. Surette ◽  
J.M. Dunn ◽  
...  
Author(s):  
Viktor M. Petrov ◽  
Petr M. Agruzov ◽  
Vladimir V. Lebedev ◽  
Igor V. Il'ichev ◽  
Aleksandr V. Shamray

2013 ◽  
Vol 38 (16) ◽  
pp. 3001 ◽  
Author(s):  
Richard R. Grote ◽  
Jeffrey B. Driscoll ◽  
Richard M. Osgood, Jr.

1998 ◽  
Vol 531 ◽  
Author(s):  
Hirotoshi Nagata ◽  
Naoki Mitsugi ◽  
Kaoru Higuma ◽  
Junichiro Ichikawa ◽  
Toshihiro Sakamoto ◽  
...  

AbstractIncreasing demands for LiNbO3 (LN) optical waveguide devices installed into submarine and terrestrial fiber communication systems necessitate that high quality and long-term reliability (over 20 years) be established. In addition to general requirements for reliability in electrooptical devices, the LN devices need to assure of the dc-drift phenomena in the optical output signal. The dc-drift is caused by the complex electrical nature of constituent device materials; i.e. LN substrates and SiO2 buffer layers on LN. Results of theoretical and experimental investigations of the suppression of dc-drift are applied to the design of practical LN devices, and the devices have been in service for 4 years, as of this moment, without any failure. Here, problems on the dc-drift are discussed from the viewpoints of device reliability and actual fabrication processes.


1989 ◽  
Author(s):  
Mark Lowry ◽  
Greg Lancaster ◽  
Richard T. Peterson ◽  
Bill Kidd ◽  
Dan Nelson ◽  
...  

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