Design and fabrication of diffractive optical element applied to vertical-cavity surface emitting laser.doc

2010 ◽  
Author(s):  
Sheng-Hsiung Chang ◽  
Tsair-Chun Liang ◽  
Cheng-Feng Yue ◽  
Bo-Hong Ke
Keyword(s):  
Optical Element ◽  
Diffractive Optical Element ◽  
Cavity Surface ◽  
Vertical Cavity Surface ◽  
Vertical Cavity

Type II W, interband cascade and vertical-cavity surface-emitting mid-IR lasers

1998 ◽  
Vol 145 (5) ◽  
pp. 275-280 ◽  
Author(s):  
J.R. Meyer ◽  
D. Zhang ◽  
W.W. Bewley ◽  
C.L. Felix ◽  
L. Goldberg ◽  
...  
Keyword(s):  
Cavity Surface ◽  
Type Ii ◽  
Vertical Cavity Surface ◽  
Vertical Cavity

Recent developments in the area of vertical cavity surface emitting lasers

1999 ◽  
Vol 09 (PR2) ◽  
pp. Pr2-3 ◽  
Author(s):  
J. Jacquet ◽  
P. Salet ◽  
A. Plais ◽  
F. Brillouet ◽  
E. Derouin ◽  
...  
Keyword(s):  
Cavity Surface ◽  
Surface Emitting Lasers ◽  
Recent Developments ◽  
Vertical Cavity Surface ◽  
Emitting Lasers ◽  
Vertical Cavity

Failure Analysis of Vertical Cavity Surface Emission Laser Diodes

2003 ◽  
Author(s):  
F. Siegelin ◽  
C. Brillert
Keyword(s):  
Failure Analysis ◽  
Complete Analysis ◽  
Cavity Surface ◽  
Dislocation Network ◽  
Plan View ◽  
Surface Emission ◽  
Optical Output ◽  
Vertical Cavity Surface ◽  
Vcsel Arrays ◽  
Vertical Cavity

Abstract A failure analysis case study for oxide confined vertical cavity surface emitting laser (VCSEL) arrays will be presented. The focus of this work is on devices failing with a reduced optical output due to a rapid degradation of the laser diode. The complete analysis flow will be shown, including electrical and optical characterization as well as detailed investigations on a nanometer scale. It is known that these fails are caused by dislocations. An advanced FIB preparation method enabled cross-section and plan view TEM to successfully visualize the complete extent of a dislocation network.

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