Measurement of carrier escape rates, exciton saturation intensity, and saturation density in electrically biased multiple-quantum-well modulators
1994 ◽
Vol 30
(2)
◽
pp. 399-407
◽
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1992 ◽
Vol 4
(7)
◽
pp. 720-723
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2014 ◽
Vol 4
(2)
◽
pp. 607-613
◽
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1987 ◽
Vol 48
(C5)
◽
pp. C5-457-C5-461
Keyword(s):