Femtosecond pulse phase measurement by spectrally resolved up-conversion: application to continuum compression

1992 ◽  
Vol 28 (10) ◽  
pp. 2285-2290 ◽  
Author(s):  
J.-P. Foing ◽  
J.-P. Likforman ◽  
M. Joffre ◽  
A. Migus
Keyword(s):  
Femtosecond Pulse ◽  
Phase Measurement ◽  
Pulse Phase ◽  
Spectrally Resolved

Computer Controlled Pulse Phase Measurement System

1984 ◽  
Author(s):  
Michael Little ◽  
Leon Stevens ◽  
Thomas McEwen ◽  
Edward Jones
Keyword(s):  
Measurement System ◽  
Phase Measurement ◽  
Pulse Phase ◽  
Computer Controlled

Spectral phase measurement of complex pulses using delay controlled fringe free interferometry technique

2014 ◽  
Vol 23 (02) ◽  
pp. 1450017 ◽  
Author(s):  
Liang Lei ◽  
Xin Liu ◽  
Jin-Hui Wen ◽  
Xiao-Bo Xing ◽  
Bo Wang ◽  
...  
Keyword(s):  
Numerical Simulation ◽  
Fourier Transform ◽  
Electric Field ◽  
Femtosecond Pulse ◽  
Phase Measurement ◽  
Spectral Phase ◽  
Pulse Measurement ◽  
Field Reconstruction ◽  
Small Delay ◽  
Free Spectra

The shortcomings in complex femtosecond pulse measurement of conventional spectral phase interferometry for direct electric-field reconstruction (SPIDER) are commented in this paper. To solve the problem, we propose an improved version of SPIDER, where single replica of the unknown pulse upconverts synchronously with two frequency-shifted narrow-banded long pulses. With the introduction of a suitable small delay between the upconverted pulses, the spectral phase of the unknown pulse can be directly calculated from the fringe-free spectra and Fourier-transform filtering is not required. The results of numerical simulation show that the accuracy of the new method in complex pulse measurement is higher than conventional SPIDER.

scholarly journals Femtosecond Pulse Phase Measurements of Mode-locked Ti3+:Al2O3 Lasers.

1994 ◽  
Vol 22 (10) ◽  
pp. 843-849
Author(s):  
Kazuya TAKASAGO ◽  
Tetsuya ITOH ◽  
Fumihiko KANNARI
Keyword(s):  
Femtosecond Pulse ◽  
Phase Measurements ◽  
Pulse Phase

Performance and applications of the holography electron microscope

1993 ◽  
Vol 51 ◽  
pp. 1078-1079
Author(s):  
Akira Tonomura
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Phase Measurement ◽  
Electron Holography ◽  
Imaging Method ◽  
High Contrast ◽  
Magnetic Lens ◽  
High Brightness ◽  
Holographic Imaging ◽  
Dynamic Observation

Electron holography is a two-step imaging method. However, the ultimate performance of holographic imaging is mainly determined by the brightness of the electron beam used in the hologram-formation process. In our 350kV holography electron microscope (see Fig. 1), the decrease in the inherently high brightness of field-emitted electrons is minimized by superposing a magnetic lens in the gun, for a resulting value of 2 × 109 A/cm2 sr. This high brightness has lead to the following distinguished features. The minimum spacing (d) of carrier fringes is d = 0.09 Å, thus allowing a reconstructed image with a resolution, at least in principle, as high as 3d=0.3 Å. The precision in phase measurement can be as high as 2π/100, since the position of fringes can be known precisely from a high-contrast hologram formed under highly collimated illumination. Dynamic observation becomes possible because the current density is high.

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