Laser diodes with integrated spot-size transformer as low-cost optical transmitter elements for telecommunications

1997 ◽  
Vol 3 (6) ◽  
pp. 1372-1383 ◽  
Author(s):  
B. Hubner ◽  
G. Vollrath ◽  
R. Ries ◽  
C. Greus ◽  
H. Janning ◽  
...  
Keyword(s):  
Low Cost ◽  
Laser Diodes ◽  
Spot Size ◽  
Optical Transmitter

Reliability of 1300-nm spot-size converter integrated laser diodes for low-cost optical modules in access networks

1998 ◽  
Vol 16 (7) ◽  
pp. 1302-1307 ◽  
Author(s):  
H. Oohashi ◽  
M. Fukuda ◽  
Y. Kondo ◽  
N. Wada ◽  
Y. Tohmori ◽  
...  
Keyword(s):  
Low Cost ◽  
Laser Diodes ◽  
Spot Size ◽  
Access Networks

Highly reliable spot-size converter integrated laser diodes over a wide temperature range for access network systems

2001 ◽  
Vol 41 (1) ◽  
pp. 111-118 ◽  
Author(s):  
H Oohashi ◽  
M Fukuda ◽  
Y Kondo ◽  
M Yamamoto ◽  
Y Kadota ◽  
...  
Keyword(s):  
Wide Temperature Range ◽  
Laser Diodes ◽  
Access Network ◽  
Spot Size ◽  
Network Systems ◽  
Temperature Range

1.3 [micro sign]m laser diodes with butt-jointed selectively grown spot-size converters uniformly fabricated on a 2 in InP substrate

1996 ◽  
Vol 32 (12) ◽  
pp. 1099 ◽  
Author(s):  
H. Okamoto ◽  
Y. Suzuki ◽  
Y. Tohmori ◽  
M. Okamoto ◽  
Y. Kondo ◽  
...  
Keyword(s):  
Laser Diodes ◽  
Spot Size ◽  
Inp Substrate

High-coupling-efficiency laser diodes integrated with spot-size converters fabricated on 2 inch InP substrates

1995 ◽  
Vol 31 (24) ◽  
pp. 2102-2104 ◽  
Author(s):  
M. Wada ◽  
K. Kishi ◽  
K. Kawano ◽  
Y. Noguchi ◽  
Y. Kadota ◽  
...  
Keyword(s):  
Laser Diodes ◽  
Coupling Efficiency ◽  
Spot Size ◽  
Inp Substrates

Communications: Ten billion bits on a disk: High-power laser diodes and pregrooved disks enable low-cost digital data recording and retrieval

IEEE Spectrum ◽  
1979 ◽  
Vol 16 (8) ◽  
pp. 26-33 ◽  
Author(s):  
Kees Bulthuis ◽  
Marino G. Carasso ◽  
Jaques P. J. Heemskerk ◽  
Peter J. Kivits ◽  
Wilhalm J. Kleuters ◽  
...  
Keyword(s):  
High Power ◽  
Low Cost ◽  
Laser Diodes ◽  
Digital Data ◽  
Data Recording ◽  
High Power Laser ◽  
Power Laser

Evaluation of SEE on a 32-bit Microprocessor by Laser Test and Heavy Ion Test

2015 ◽  
Vol 1105 ◽  
pp. 391-396
Author(s):  
Chun Qing Yu ◽  
Long Fan ◽  
Suge Yue ◽  
Jian Hua Ma ◽  
Hong Chao Zheng
Keyword(s):  
Laser Pulse ◽  
Low Cost ◽  
Step Length ◽  
Heavy Ion ◽  
Spot Size ◽  
Single Event ◽  
Laser Spot Size ◽  
Scanning Step ◽  
Instruction Pipeline ◽  
Made In

In this paper the SEE (single event effects) of different parts of device were explored on a 32-bit microprocessor with a five-stage instruction pipeline by laser test and heavy ion test. The cross section curves for different function units were obtained and the comparison of the dates obtained from laser test and heavy ion tests was made. In addition, laser test under different scanning steps were made which indicate that when the scanning step length is in small steps which is considerably equivalent to the laser spot size, there is little change in the number of single event errors caused by each laser pulse. Wherever with the scanning step increasing, the number of single event errors caused by each laser pulse will be reduced. Experiment results suggest that there are differences between laser test and the heavy ion test but have a similar trend. The pulsed laser is an extremely powerful and low-cost technique for SEE testing and will provide invaluable information in characterizing SEE in integrate circuits.

scholarly journals Oxide-confined laser diodes with an integrated spot-size converter

2002 ◽  
Vol 8 (6) ◽  
pp. 1372-1380
Author(s):  
K. De Mesel ◽  
S. Verstuyft ◽  
I. Moerman ◽  
P. Van Daele ◽  
R. Baets
Keyword(s):  
Laser Diodes ◽  
Spot Size
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