Experimental study and modeling of the white noise sources in submicron Pand N-MOSFETs
2001 ◽
Vol 48
(4)
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pp. 1577-1586
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Keyword(s):
2004 ◽
Vol 40
(06)
◽
pp. 192
◽
Keyword(s):
Keyword(s):
Keyword(s):