Fast wire per wire X-ray data acquisition system for time-resolved small angle scattering experiments

2000 ◽  
Vol 47 (2) ◽  
pp. 70-74 ◽  
Author(s):  
A. Epstein ◽  
F. Briquet-Laugier ◽  
S. Sheldon ◽  
C. Boulin
Keyword(s):  
Data Acquisition ◽  
Small Angle ◽  
Data Acquisition System ◽  
Small Angle Scattering ◽  
Acquisition System ◽  
Time Resolved ◽  
X Ray ◽  
Angle Scattering

scholarly journals V4: The Small Angle Scattering Instrument (SANS) at BER II

2016 ◽  
Vol 2 ◽  
Author(s):  
Uwe Keiderling ◽  
Charl Jafta
Keyword(s):  
Data Acquisition ◽  
Time Resolution ◽  
Small Angle ◽  
Small Angle Scattering ◽  
List Mode ◽  
Time Resolved ◽  
Angle Scattering ◽  
Polarized Neutron ◽  
Time Resolved Measurements

V4 is a small-angle neutron scatting instrument with an accessible range of scattering vector 0.01 nm-1 < Q < 8.5 nm-1. Outstanding features of the instrument are the polarized neutron option and the list mode data acquisition, allowing for time-resolved measurements with µs time resolution.

Small-Angle X-ray Scattering at the ESRF High-Brilliance Beamline

1997 ◽  
Vol 30 (5) ◽  
pp. 867-871 ◽  
Author(s):  
P. Bösecke ◽  
O. Diat
Keyword(s):  
Small Angle ◽  
Small Angle Scattering ◽  
Optical Systems ◽  
Photon Flux ◽  
X Rays ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Ray Scattering

The high-brilliance beamline (BL4/ID2) at the European Synchrotron Radiation Facility (ESRF) in Grenoble has been constructed with the emphasis on time-resolved small-angle X-ray scattering and macromolecular crystallography. It has been open to users for two years. The beamline has opened up new areas in small-angle scattering research, facilitating (a) small-angle crystallography on structures with unit cells of several hundredths of nanometres, (b) overlap with the light scattering range for the study of optical systems, (c) high photon flux for time-resolved experiments and (d) a high spatial coherence allowing submicrometre imaging with X-rays. The set-up and the detector system of the small-angle scattering station are presented. A method for obtaining absolute scattering intensities is described. The parasitic background at the station is discussed in terms of absolute scattering intensities.

Performance and First Results of the ELETTRA High-Flux Beamline for Small-Angle X-ray Scattering

1997 ◽  
Vol 30 (5) ◽  
pp. 872-876 ◽  
Author(s):  
H. Amenitsch ◽  
S. Bernstorff ◽  
M. Kriechbaum ◽  
D. Lombardo ◽  
H. Mio ◽  
...  
Keyword(s):  
Small Angle ◽  
Small Angle Scattering ◽  
Design Parameters ◽  
High Flux ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

A new beamline for small-angle X-ray scattering (SAXS) has recently been constructed and is presently under final commissioning at the 2 GeV storage ring ELETTRA. It has been designed specifically for time-resolved studies of non-crystalline and fibrous materials and has been optimized for small-angle scattering measurements. The beamline operates with a SAXS resolution between 10 and about 1400 Å in d spacing (at 8 keV) and has been optimized with respect to high flux at the sample [of the order of 1013 photons s−1 for 8 keV photons (2 GeV, 400 mA)]. Soon it will be possible to perform simultaneously wide-angle diffraction measurements in the d-spacing range 1.2–8 Å (at 8 keV). In order to allow time-resolved (resolution ~1 ms) small-angle scattering measurements, a high-power 57-pole wiggler is used as the beamline source. From its beam, one of three discrete energies, 5.4, 8 and 16 keV, can be selected with a double-crystal monochromator, which contains three pairs of asymmetrically cut plane Si(111) crystals. Downstream, the beam is focused horizontally and vertically by a toroidal mirror. Commissioning tests of this new SAXS beamline showed that all design parameters have been realized.

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