Development of a high speed X-ray tomography system for multiphase flow imaging

1999 ◽  
Vol 46 (3) ◽  
pp. 380-384 ◽  
Author(s):  
E.J. Morton ◽  
R.D. Luggar ◽  
M.J. Key ◽  
A. Kundu ◽  
L.M.N. Tavora ◽  
...  
2009 ◽  
Author(s):  
Eiichi Sato ◽  
Toshiyuki Enomoto ◽  
Manabu Watanabe ◽  
Keitaro Hitomi ◽  
Kiyomi Takahashi ◽  
...  

1979 ◽  
Vol 26 (2) ◽  
pp. 2713-2717 ◽  
Author(s):  
R. A. Robb ◽  
E. L. Ritman ◽  
B. K. Gilbert ◽  
J. H. Kinsey ◽  
L. D. Harris ◽  
...  

2008 ◽  
Author(s):  
Eiichi Sato ◽  
Toshiyuki Enomoto ◽  
Toshiaki Kawai ◽  
Mitsuru Izumisawa ◽  
Koetsu Sato ◽  
...  

Author(s):  
Brian Cross

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.


Author(s):  
Marc H. Peeters ◽  
Max T. Otten

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.


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