Noise characterization of transistors in a 1.2 /spl mu/m CMOS-SOI technology up to a total-dose of 12 Mrad (Si)

1994 ◽  
Vol 41 (6) ◽  
pp. 2310-2316 ◽  
Author(s):  
F. Faccio ◽  
M. Bianchi ◽  
M. Fornasari ◽  
E.H.M. Heijne ◽  
P. Jarron ◽  
...  
Keyword(s):  
Total Dose ◽  
Noise Characterization ◽  
Soi Technology

Noise Characterization of InAs Based Composite Channel DG -MOSHEMT with Different Gate Dielectrics

Silicon ◽  
2021 ◽  
Author(s):  
G. Sujatha ◽  
N. Mohankumar ◽  
R. Poornachandran ◽  
R. Saravana Kumar ◽  
Girish Shankar Mishra ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Composite Channel ◽  
Noise Characterization

Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

2004 ◽  
Author(s):  
Jean-Guy Tartarin ◽  
Geoffroy Soubercaze-Pun ◽  
Abdelali Rennane ◽  
Laurent Bary ◽  
Robert Plana ◽  
...  
Keyword(s):  
Technology Assessment ◽  
Low Frequency ◽  
Failure Prediction ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gan Hemt ◽  
Noise Characterization

Total-dose characterization of CMOS/SOI-ZMR technology

1992 ◽  
Vol 39 (3) ◽  
pp. 381-386 ◽  
Author(s):  
O. Coumar ◽  
R. Gaillard
Keyword(s):  
Total Dose

Aerodynamic Noise Characterization of a Full-Scale Wind Turbine through High-Frequency Surface Pressure Measurements

2015 ◽  
Vol 14 (5-6) ◽  
pp. 729-766 ◽  
Author(s):  
Franck Bertagnolio ◽  
Helge Aa. Madsen ◽  
Christian Bak ◽  
Niels Troldborg ◽  
Andreas Fischer
Keyword(s):  
Wind Turbine ◽  
Surface Pressure ◽  
High Frequency ◽  
Full Scale ◽  
Aerodynamic Noise ◽  
Pressure Measurements ◽  
Noise Characterization

Flow noise characterization of gas–liquid two-phase flow based on acoustic emission

Measurement ◽  
2013 ◽  
Vol 46 (10) ◽  
pp. 3887-3897 ◽  
Author(s):  
Lide Fang ◽  
Yujiao liang ◽  
Qinghua Lu ◽  
Xiaoting Li ◽  
Ran Liu ◽  
...  
Keyword(s):  
Acoustic Emission ◽  
Two Phase Flow ◽  
Phase Flow ◽  
Two Phase ◽  
Flow Noise ◽  
Noise Characterization

PERFORMANCE LIMITS OF SIMULATION MODELS FOR NOISE CHARACTERIZATION OF MM WAVE DEVICES

2007 ◽  
Vol 07 (03) ◽  
pp. L299-L312
Author(s):  
ALI ABOU-ELNOUR
Keyword(s):  
Boltzmann Transport Equation ◽  
Simulation Models ◽  
Two Dimensions ◽  
Boltzmann Transport ◽  
Performance Limits ◽  
Drift Diffusion ◽  
Model Equations ◽  
Accuracy Of Results ◽  
Noise Characterization

Based on Boltzmann transport equation, the drift-diffusion, hydrodynamic, and Monte-Carlo physical simulators are accurately developed. For each simulator, the model equations are self-consistently solved with Poisson equation, and with Schrödinger equation when quantization effects take place, in one and two-dimensions to characterize the operation and optimize the structure of mm-wave devices. The effects of the device dimensions, biasing conditions, and operating frequencies on the accuracy of results obtained from the simulators are thoroughly investigated. Based on physical understanding of the models, the simulation results are analyzed to fully determine the limits at which a certain device simulator can be accurately and efficiently used to characterize the noise behavior of mm-wave devices.

scholarly journals Noise characterization of a subsea tidal kite

2018 ◽  
Vol 144 (5) ◽  
pp. EL441-EL446 ◽  
Author(s):  
Pál Schmitt ◽  
Matthew K. Pine ◽  
Ross M. Culloch ◽  
Lilian Lieber ◽  
Louise T. Kregting
Keyword(s):  
Noise Characterization
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