New, high performance nuclear spectroscopy system using Si-PIN diodes and CdTe detectors

1994 ◽  
Vol 41 (4) ◽  
pp. 1004-1008 ◽  
Author(s):  
J. Pantazis ◽  
A. Huber ◽  
P. Okun ◽  
M.R. Squillante ◽  
P. Waer ◽  
...  
Keyword(s):  
High Performance ◽  
Nuclear Spectroscopy ◽  
Pin Diodes ◽  
Spectroscopy System

Development of multichannel analyzer using sound card ADC for nuclear spectroscopy system

2014 ◽  
Author(s):  
Maslina Mohd Ibrahim ◽  
Nolida Yussup ◽  
Lojius Lombigit ◽  
Nur Aira Abdul Rahman ◽  
Zainudin Jaafar
Keyword(s):  
Nuclear Spectroscopy ◽  
Sound Card ◽  
Multichannel Analyzer ◽  
Spectroscopy System

Spectroscopy of laser-produced plasmas: Setting up of high-performance laser-induced breakdown spectroscopy system

Pramana ◽  
2010 ◽  
Vol 75 (6) ◽  
pp. 1145-1150 ◽  
Author(s):  
V. K. Unnikrishnan ◽  
Kamlesh Alti ◽  
Rajesh Nayak ◽  
Rodney Bernard ◽  
V. B. Kartha ◽  
...  
Keyword(s):  
High Performance ◽  
Laser Induced Breakdown Spectroscopy ◽  
Breakdown Spectroscopy ◽  
Laser Induced Breakdown ◽  
Spectroscopy System

scholarly journals High-Performance Q-Band MMIC Phase Shifters Using InGaAs PIN Diodes

2009 ◽  
Vol 9 (3) ◽  
pp. 159-163 ◽  
Author(s):  
Mun-Ho Kim ◽  
Jung-Gil Yang ◽  
Kyoung-Hoon Yang
Keyword(s):  
High Performance ◽  
Phase Shifters ◽  
Pin Diodes

Full Color Display With Amorphous Silicon Pin Diodes For High Performance Applications

1989 ◽  
Author(s):  
Adi Abileah ◽  
Vincent Cannella ◽  
John McGill ◽  
Yair Baron ◽  
Meera Vijan ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
High Performance ◽  
Pin Diodes ◽  
Color Display ◽  
Full Color

High performance gated lateral polysilicon PIN diodes

2000 ◽  
Vol 44 (9) ◽  
pp. 1613-1619 ◽  
Author(s):  
Mark Stewart ◽  
Miltiadis K Hatalis
Keyword(s):  
High Performance ◽  
Pin Diodes

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

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