Ionization radiation induced degradation of MOSFET channel frequency response
1989 ◽
Vol 36
(3)
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pp. 1359-1366
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Keyword(s):
2020 ◽
Vol 63
(8)
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pp. 418-429
Keyword(s):
2021 ◽
Vol 39
(4)
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pp. 254-264
2011 ◽
Vol 128-129
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pp. 874-877
Keyword(s):
2016 ◽
Vol 15
(9)
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pp. 5875-5888
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Keyword(s):