A new extraction method for the two-parameter FET temperature noise model
1998 ◽
Vol 46
(11)
◽
pp. 1679-1685
◽
1997 ◽
Vol 16
(4)
◽
pp. 208-212
◽
2002 ◽
Vol 50
(8)
◽
pp. 1927-1934
◽
Keyword(s):
Keyword(s):