Microstructural characterization of YBa/sub 2/Cu/sub 3/O/sub 7- delta / thin films on SrTiO/sub 3/ using four-axis X-ray diffraction

1989 ◽  
Vol 25 (2) ◽  
pp. 2245-2249 ◽  
Author(s):  
J. Sizemore ◽  
R. Barton ◽  
A. Marshall ◽  
J.C. Bravman ◽  
M. Naito ◽  
...  
Keyword(s):  
Thin Films ◽  
Microstructural Characterization ◽  
X Ray Diffraction ◽  
X Ray

Bidimensional X-ray Diffraction Analysis for Structural and Microstructural Characterization of Lanthanum Manganite Thin Films

2004 ◽  
Vol 108 (17) ◽  
pp. 5189-5191
Author(s):  
Ivano Alessandri ◽  
Marcello Gelfi ◽  
Elza Bontempi ◽  
Roberto Roberti ◽  
Laura E. Depero
Keyword(s):  
Thin Films ◽  
Diffraction Analysis ◽  
Microstructural Characterization ◽  
Lanthanum Manganite ◽  
X Ray Diffraction ◽  
X Ray

Influence of the Residue of Casting by Lost Wax in the Modulus of Elasticity and Porosity of Concretes

2014 ◽  
Vol 805 ◽  
pp. 343-349
Author(s):  
Carine F. Machado ◽  
Weber G. Moravia
Keyword(s):  
Construction Industry ◽  
Modulus Of Elasticity ◽  
Chemical Characterization ◽  
Microstructural Characterization ◽  
Cement Matrix ◽  
X Ray Diffraction ◽  
X Ray ◽  
Hardened State ◽  
Material Powder

This work evaluated the influence of additions of the ceramic shell residue (CSR), from the industries of Lost Wax Casting, in the modulus of elasticity and porosity of concrete. The CSR was ground and underwent a physical, chemical, and microstructural characterization. It was also analyzed, the environmental risk of the residue. In the physical characterization of the residue were analyzed, the surface area, and particle size distribution. In chemical characterization, the material powder was subjected to testing of X-ray fluorescence (XRF). Microstructural characterization was performed by scanning electron microscopy (SEM) and X-ray diffraction (XRD). The residue was utilized like addition by substitution of cement in concrete in the percentages of 10% and 15% by weight of Portland cement. It was evaluated properties of concrete in the fresh and hardened state, such as compressive strength, modulus of elasticity, absorption of water by total immersion and by capillarity. The results showed that the residue can be used in cement matrix and improve some properties of concrete. Thus, the CSR may contribute to improved sustainability and benefit the construction industry.

Structural and Optical Characterization of Zinc Telluride Thin Films

2013 ◽  
Vol 665 ◽  
pp. 254-262 ◽  
Author(s):  
J.R. Rathod ◽  
Haresh S. Patel ◽  
K.D. Patel ◽  
V.M. Pathak
Keyword(s):  
Thin Films ◽  
Extinction Coefficient ◽  
Nir Spectroscopy ◽  
Optical Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Evaporation Technique ◽  
Film Form ◽  
Znte Thin Films

Group II-VI compounds have been investigated largely in last two decades due to their interesting optoelectronic properties. ZnTe, a member of this family, possesses a bandgap around 2.26eV. This material is now a day investigated in thin film form due to its potential towards various viable applications. In this paper, the authors report their investigations on the preparation of ZnTe thin films using vacuum evaporation technique and their structural and optical characterizations. The structural characterization, carried out using an X-ray diffraction (XRD) technique shows that ZnTe used in present case possesses a cubic structure. Using the same data, the micro strain and dislocation density were evaluated and found to be around 1.465×10-3lines-m2and 1.639×1015lines/m2respecctively. The optical characterization carried out in UV-VIS-NIR region reveals the fact that band gap of ZnTe is around 2.2eV in present case. In addition to this, it was observed that the value of bandgap decreases as the thickness of films increases. The direct transitions of the carries are involved in ZnTe. Using the data of UV-VIS-NIR spectroscopy, the transmission coefficient and extinction coefficient were also calculated for ZnTe thin films. Besides, the variation of extinction coefficient with wavelength has also been discussed here.

scholarly journals Characterization of superconducting oxide thin films by X-ray diffraction.

1990 ◽  
Vol 37 (1) ◽  
pp. 141-144
Author(s):  
Tsunekazu Iwata ◽  
Akihiko Yamaji ◽  
Youichi Enomoto
Keyword(s):  
Thin Films ◽  
X Ray Diffraction ◽  
Oxide Thin Films ◽  
X Ray

Application of Aluminum Nitride Thin Film for Micromachined Ultrasonic Transducers

2005 ◽  
Vol 892 ◽  
Author(s):  
Qianghua Wang ◽  
Jianzeng Xu ◽  
Changhe Huang ◽  
Gregory W Auner
Keyword(s):  
Thin Films ◽  
Aluminum Nitride ◽  
Ultrasonic Transducers ◽  
X Ray Diffraction ◽  
Effective Coupling ◽  
Resonant Frequencies ◽  
X Ray ◽  
Coupling Factors ◽  
Sandwiched Structure

AbstractThis paper reports the fabrication and characterization of micromachined ultrasonic transducers (MUT) based on piezoelectric aluminum nitride (AlN) thin films. The MUT device is composed of an Al/AlN/Al sandwiched structure overlaid on top of a silicon (Si) diaphragm. X-ray diffraction (XRD) scan shows that highly c-axis oriented AlN (002) thin films have been grown on Al/Si(100) substrates. Electrical impedance of the MUT devices is analyzed as a function of frequency. The fundamental resonant frequencies of the devices are found in the range of 65-70 kHz, which are in approximation to the theoretical calculation. The effective coupling factors of the devices are also derived as 0.18.

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